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Applied Physics Letters

Volumn 93, Issue 11, 2008, Pages

Tunable effective permittivity of carbon nanotube composites

(3) Liu, L a Kong, L B a Matitsine, S a

a NATIONAL UNIVERSITY OF SINGAPORE (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

BIAS VOLTAGE; CARBON CARBON COMPOSITES; DIELECTRIC PROPERTIES; DIELECTRIC PROPERTIES OF SOLIDS; MATERIALS PROPERTIES; NANOCOMPOSITES; NANOPORES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTECHNOLOGY; NANOTUBES; PERCOLATION (FLUIDS);

APPLIED BIAS VOLTAGE; APPLIED VOLTAGES; CARBON NANOTUBES (CNTS); CARBON-NANOTUBE COMPOSITES; EFFECTIVE PERMITTIVITY; EXTERNAL-; IMAGINARY PARTS; PERCOLATION THRESHOLDS; POTENTIAL APPLICATIONS; REAL PART; SMART MATERIALS AND STRUCTURES; TUNABLE DIELECTRICS; TUNABLE PROPERTIES;

CARBON NANOTUBES;

EID: 52349115936 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2983745 Document Type: Article

Times cited : (35)

References (18)

1
- 0003902780
- (Dekker, New York).
- J. B. Donnet, R. C. Bansal, and M. J. Wang, Carbon Black: Science and Technology (Dekker, New York, 1993).
- (1993) Carbon Black: Science and Technology
- Donnet, J.B.¹ Bansal, R.C.² Wang, M.J.³

2
- 0001610250
- JAPIAU 0021-8979 10.1063/1.368559.
- A. N. Lagarkov, S. M. Matytsin, K. N. Rozanov, and A. K. Sarychev, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.368559 84, 3806 (1998).
- (1998) J. Appl. Phys. , vol.84 , pp. 3806
- Lagarkov, A.N.¹ Matytsin, S.M.² Rozanov, K.N.³ Sarychev, A.K.⁴

3
- 1842474412
- IEMCAE 0018-9375 10.1109/TEMC.2004.823618.
- C. P. Neo and V. K. Varadan, IEEE Trans. Electromagn. Compat. IEMCAE 0018-9375 10.1109/TEMC.2004.823618 46, 102 (2004).
- (2004) IEEE Trans. Electromagn. Compat. , vol.46 , pp. 102
- Neo, C.P.¹ Varadan, V.K.²

4
- 0342819025
- NATUAS 0028-0836 10.1038/354056a0.
- S. Iijima, Nature (London) NATUAS 0028-0836 10.1038/354056a0 354, 56 (1991).
- (1991) Nature (London) , vol.354 , pp. 56
- Iijima, S.¹

5
- 34248585446
- JAPIAU 0021-8979 10.1063/1.2728765.
- L. Liu, S. Matitsine, Y. B. Gan, L. F. Chen, L. B. Kong, and K. N. Rozanov, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.2728765 101, 094106 (2007).
- (2007) J. Appl. Phys. , vol.101 , pp. 094106
- Liu, L.¹ Matitsine, S.² Gan, Y.B.³ Chen, L.F.⁴ Kong, L.B.⁵ Rozanov, K.N.⁶

6
- 0037636292
- JAPIAU 0021-8979 10.1063/1.1570935.
- C. Brosseau, J. Ben Youssef, P. Talbot, and A. M. Konn, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1570935 93, 9243 (2003).
- (2003) J. Appl. Phys. , vol.93 , pp. 9243
- Brosseau, C.¹ Ben Youssef, J.² Talbot, P.³ Konn, A.M.⁴

7
- 0344084188
- JAPIAU 0021-8979 10.1063/1.1622772.
- B. K. Kim, J. Lee, and I. Yu, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1622772 94, 6724 (2003).
- (2003) J. Appl. Phys. , vol.94 , pp. 6724
- Kim, B.K.¹ Lee, J.² Yu, I.³

8
- 0035886099
- JAPIAU 0021-8979 10.1063/1.1400100.
- C. A. Grimes, E. C. Dickey, C. Mungle, K. G. Ong, and D. Qian, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1400100 90, 4134 (2001).
- (2001) J. Appl. Phys. , vol.90 , pp. 4134
- Grimes, C.A.¹ Dickey, E.C.² Mungle, C.³ Ong, K.G.⁴ Qian, D.⁵

9
- 18644382451
- JAPIAU 0021-8979 10.1063/1.1506397.
- B. E. Kilbride, J. N. Coleman, J. Fraysse, P. Fournet, M. Cadek, A. Drury, S. Hutzler, S. Roth, and W. J. Blau, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1506397 92, 4024 (2002).
- (2002) J. Appl. Phys. , vol.92 , pp. 4024
- Kilbride, B.E.¹ Coleman, J.N.² Fraysse, J.³ Fournet, P.⁴ Cadek, M.⁵ Drury, A.⁶ Hutzler, S.⁷ Roth, S.⁸ Blau, W.J.⁹

10
- 0141563453
- CHPLBC 0009-2614 10.1016/j.cplett.2003.07.002.
- P. C. P. Watts, D. R. Ponnampalam, W. K. Hsu, A. Barnes, and B. Chambers, Chem. Phys. Lett. CHPLBC 0009-2614 10.1016/j.cplett.2003.07.002 378, 609 (2003).
- (2003) Chem. Phys. Lett. , vol.378 , pp. 609
- Watts, P.C.P.¹ Ponnampalam, D.R.² Hsu, W.K.³ Barnes, A.⁴ Chambers, B.⁵

11
- 0032343784
- JAPIAU 0021-8979 10.1063/1.368925.
- S. L. Browning, J. Lodge, R. R. Price, J. Schelleng, P. E. Schoen, and D. Zabetakis, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.368925 84, 6109 (1998).
- (1998) J. Appl. Phys. , vol.84 , pp. 6109
- Browning, S.L.¹ Lodge, J.² Price, R.R.³ Schelleng, J.⁴ Schoen, P.E.⁵ Zabetakis, D.⁶

12
- 0041379153
- POLMAG 0032-3861 10.1016/S0032-3861(03)00539-1.
- J. K. W. Sandler, J. E. Kirk, I. A. Kinloch, M. S. P. Shaffer, and A. H. Windle, Polymer POLMAG 0032-3861 10.1016/S0032-3861(03)00539-1 44, 5893 (2003).
- (2003) Polymer , vol.44 , pp. 5893
- Sandler, J.K.W.¹ Kirk, J.E.² Kinloch, I.A.³ Shaffer, M.S.P.⁴ Windle, A.H.⁵

13
- 0002681610
- 0028-0836
- S. J. Tans, A. R. Verschueren, and C. Dekker, Nature (London) 49, 393 (1998). 0028-0836
- (1998) Nature (London) , vol.49 , pp. 393
- Tans, S.J.¹ Verschueren, A.R.² Dekker, C.³

14
- 0037009625
- PRLTAO 0031-9007 10.1103/PhysRevLett.89.106801.
- S. Heinze, J. Tersoff, R. Martel, V. Derycke, J. Appenzeller, and Ph. Avouris, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.89.106801 89, 106801 (2002).
- (2002) Phys. Rev. Lett. , vol.89 , pp. 106801
- Heinze, S.¹ Tersoff, J.² Martel, R.³ Derycke, V.⁴ Appenzeller, J.⁵ Avouris, Ph.⁶

15
- 0004036558
- (Pergamon, UK).
- T. D. Burchell, Carbon Materials for Advanced Technologies (Pergamon, UK, 1999).
- (1999) Carbon Materials for Advanced Technologies
- Burchell, T.D.¹

16
- 0038370211
- Agilent Application Note No. 1369-1.
- Solutions for Measuring Permittivity and Permeability with LCR Meters and Impedance Analyzers.," Agilent Application Note No. 1369-1, 2003.
- (2003) Solutions for Measuring Permittivity and Permeability with LCR Meters and Impedance Analyzers

17
- 24144487478
- APPLAB 0003-6951 10.1063/1.1978975.
- S. Matitsine, L. Liu, L. F. Chen, Y. B. Gan, and C. K. Ong, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1978975 87, 016101 (2005).
- (2005) Appl. Phys. Lett. , vol.87 , pp. 016101
- Matitsine, S.¹ Liu, L.² Chen, L.F.³ Gan, Y.B.⁴ Ong, C.K.⁵

18
- 43049087446
- MOTLEO 0895-2477 10.1002/mo23400.
- L. Liu and S. Matitsine, Microwave Opt. Technol. Lett. MOTLEO 0895-2477 10.1002/mop.23400 50, 1510 (2008).
- (2008) Microwave Opt. Technol. Lett. , vol.50 , pp. 1510
- Liu, L.¹ Matitsine, S.²

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