Efficient EVM testing of wireless OFDM transceivers using null carriers

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 17, Issue 6, 2009, Pages 803-814

  Senguttuvan, Rajarajan ^a   Bhattacharya, Soumendu ^a   Chatterjee, Abhijit ^b  

^a TEXAS INSTRUMENTS   (United States)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Communication systems; Interference; Manufacturing testing; Test time; Wireless LAN

Indexed keywords

AUTOMATED TEST EQUIPMENT; BASE BANDS; CURRENT GENERATION; DIGITAL DATA; ERROR VECTOR MAGNITUDE; HIGH-VOLUME MANUFACTURING; INPUT SIGNAL; INTERFERENCE; MANUFACTURING TESTING; MULTITONE; MULTITONE SIGNAL; NUMBER OF DATUM; OFDM TRANSCEIVER; OVERALL COSTS; PRODUCTION TEST; PRODUCTION TESTING; SIGNAL SOURCE; SYSTEM NOISE; TEST METHOD; TEST TIME; WIRELESS LAN;

COMMUNICATION SYSTEMS; FREQUENCY ALLOCATION; MULTICARRIER MODULATION; ORTHOGONAL FREQUENCY DIVISION MULTIPLEXING; TRANSCEIVERS; WIRELESS LOCAL AREA NETWORKS (WLAN);

TESTING;

EID: 67349255747     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2008.2006074     Document Type: Article

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