Synthesis of nanodimensional ZnO and Ni-doped ZnO thin films by atom beam sputtering and study of their physical properties

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 41, Issue 7, 2009, Pages 1164-1168

  Pandey, B ^a   Ghosh, S ^a   Srivastava, P ^a   Kabiraj, D ^b   Shripati, T ^c   Lalla, N P ^c  

^a INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

^b INTER UNIVERSITY ACCELERATOR CENTRE   (India)

^c UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH   (India)

Author keywords

Atom beam sputtering; GAXRD; TEM; Transparent conducting oxide (TCO); UV vis spectroscopy; XPS

Indexed keywords

ATOM BEAM SPUTTERING; GAXRD; TEM; TRANSPARENT CONDUCTING OXIDE (TCO); UV-VIS SPECTROSCOPY; XPS;

ATOMIC SPECTROSCOPY; ATOMS; CARRIER CONCENTRATION; CONDUCTIVE FILMS; DIFFRACTION; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY; ELECTRIC RESISTANCE; FILM PREPARATION; METALLIC FILMS; NICKEL; NICKEL ALLOYS; NICKEL OXIDE; OPACITY; OXIDE FILMS; OXYGEN; OXYGEN VACANCIES; SEMICONDUCTING ZINC COMPOUNDS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC; ZINC OXIDE;

OPTICAL FILMS;

EID: 67349250435     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2009.01.016     Document Type: Article

References (29)

1. Ozgur U., Alivov Y.I., Liu C., Teke A., Reshchikov M.A., Dogan S., Vrutin V., Cho S.-J., and Morkoc H. J. Appl. Phys. 98 (2005) 041301
2. Schmidt-Mende L., and ManManus-Driscoll J.L. Mater. Today 10 (2007) 40
3. Thomas D.J. Phys. Chem. Solids 3 (1957) 229
4. Minami T. Semicond. Sci. Technol. 20 (2005) S35
5. Singh S., Rama N., and Ramachandra Rao M.S. Appl. Phys. Lett. 88 (2006) 222111
6. Ghosh S., Srivastava P., Pandey B., Saurav M., Bharadwaj P., Avasthi D.K., Kabiraj D., and ShivaPrasad S.M. Appl. Phys. A 90 (2008) 765
7. He J.H., Lao C.S., Chen L.J., Davidovic D., and Wang Z.L. J. Am. Chem. Soc. 127 (2005) 16376
8. Wakano T., Fujimura N., Morinaga Y., Abe N., Ashida A., and Ito T. Physica E 10 (2001) 260
9. Liu X., Lin F., Sun L., Cheng W., Ma X., and Shi W. Appl. Phys. Lett. 88 (2006) 062508
10. de la Cruz R.M., Pareja R., González R., Boatner L.A., and Chen Y. Phys. Rev. B 45 (1992) 6581
11. Schwartz D.A., Kittilstved K.R., and Gamelin D.R. Appl. Phys. Lett. 85 (2004) 1395
12. Sato K., and Katayama-Yoshida H. Jpn. J. Appl. Phys. 40 (2001) L334
13. Sato K., and Katayama-Yoshida H. Jpn. J. Appl. Phys. 39 (2000) L555
14. Sandratskii L.M., and Bruno P. Phys. Rev. B 73 (2006) 045203
15. Radovanovic P.V., and Gamelin D.R. Phys. Rev. B 91 (2003) 157202
16. Huang G.J., Wang J.B., Zhong X.L., Zhou G.C., and Yan H.L. J. Mater. Sci. 42 (2007) 6464
17. Avasthi D.K., Mishra Y.K., Kabiraj D., Lalla N.P., and Pivin J.C. Nanotechnology 18 (2007) 125604
18. Kumar H., Mishra Y.K., Mahopatra S., Kabiraj D., Pivin J.C., Ghosh S., and Avasthi D.K. Nucl. Instrum. Methods B 266 (2008) 1511
19. Water W., and Chu S.-Y. Mater. Lett. 55 (2002) 67
20. Miura M. Jpn. J. Appl. Phys. 21 (1982) 264
21. Wooten F. Optical Properties of Solids (1972), Academic Press, New York
22. Shimono D., Tanaka S., Torikai T., Watari T., and Muranoa M. J. Ceram. Process. Res. 2 (2001)
23. Venkataprasad S., and Deepak F.L. Solid State Commun. 135 (2005) 345
24. Burstein E. Phys. Rev. B 93 (1954) 632
25. Wagner C.D., Riggs W.M., Davis L.E., Moulder J.F., and Muilenberg G.E. Handbook of X-ray Photoelectron Spectroscopy (1979), PerkinElmer, Eden Prairie p. 80, 84
26. Chen M., Wang X., Yu Y.H., Pei Z.L., Bai X.D., Sun C., Huang R.F., and Wen L.S. Appl. Surf. Sci. 158 (2000) 134
27. Major S., Kumar S., Bhatnagar M., and Chopra K.L. Appl. Phys. Lett. 40 (1986) 394
28. Islam M.N., Ghosh T.B., Chopra K.L., and Acharya H.N. Thin Solid Films 280 (1996) 20
29. Fan J.C.C., and Goodenough J.B. J. Appl. Phys. 48 (1977) 3524