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Volumn 182, Issue 6, 2009, Pages 1450-1456

Synthesis and characterization of quaternary chalcogenides InSn2Bi3Se8 and In0.2Sn6Bi1.8Se9

Author keywords

Bismuth; Chalcogenide; Indium; Quaternary; Tin

Indexed keywords

ELECTRICAL CONDUCTIVITY; ISOSTRUCTURAL; MONOCLINIC SPACE GROUPS; NARROW BAND GAP; ORTHORHOMBIC SPACE GROUPS; QUATERNARY; SEMI-CONDUCTING PROPERTY; STOICHIOMETRIC RATIO; SYNTHESIS AND CHARACTERIZATION; THREE-DIMENSIONAL FRAMEWORKS;

EID: 67349202840     PISSN: 00224596     EISSN: 1095726X     Source Type: Journal    
DOI: 10.1016/j.jssc.2009.03.013     Document Type: Article
Times cited : (31)

References (50)
  • 30
    • 34249828362 scopus 로고    scopus 로고
    • Laboratoire des Materiaux et du Génie Physique de ľEcole Supérieure de Physique de Grenoble
    • B. Laugier, J. Bochu, Celref, 〈http://www.inpg.fr/LMGP〉; Laboratoire des Materiaux et du Génie Physique de ľEcole Supérieure de Physique de Grenoble.
    • Celref
    • Laugier, B.1    Bochu, J.2
  • 31
    • 67349175072 scopus 로고    scopus 로고
    • SAINT Version 6.22, Siemens Analytical X-ray Instruments Inc, Madison, WI, 2001
    • SAINT Version 6.22, Siemens Analytical X-ray Instruments Inc., Madison, WI, 2001.
  • 32
    • 67349196576 scopus 로고    scopus 로고
    • SHELXTL Version 6.10, Reference Manual, Siemens Analytical X-ray Systems, Inc, Madison, Madison, WI, 2000.
    • SHELXTL Version 6.10, Reference Manual, Siemens Analytical X-ray Systems, Inc, Madison, Madison, WI, 2000.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.