Thermoelectric properties and microstructure of Ba 8Al 14Si 31 and EuBa 7Al 13Si 33

Chemistry of Materials

Volumn 18, Issue 20, 2006, Pages 4939-4945

  Condron, Cathie L ^a   Kauzlarich, Susan M ^a   Gascoin, Franck ^b,c   Snyder, G Jeffery ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b California Institute of Technology   (United States)

^c UNIV MONTPELLIER   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CLATHRATE STOICHIOMETRY; MICROPROBE DATA; RARE EARTH SUBSTITUTED COMPOUND; RIETVELD REFINEMENT;

DOPING (ADDITIVES); EUROPIUM COMPOUNDS; MICROSTRUCTURE; PROBES; SEMICONDUCTOR MATERIALS; STOICHIOMETRY; THERMOELECTRICITY; X RAY POWDER DIFFRACTION;

BARIUM COMPOUNDS;

EID: 33750304834     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm061483u     Document Type: Article

References (27)

1. Ma, X.; Riffat, S. B. Appl. Therm. Eng. 2003, 23, 913.
2. Chen, G.; Dresselhaus, G.; Dresselhaus, M. S.; Fleurial, J. P.; Caillat, T. Int. Mater. Rev. 2003, 48, 45.
3. Wood, C. Rep. Prog. Phys. 1988, 51, 459.
4. Bhandari, C. M.; Rowe, D. M. Thermal Conduction in Semiconductors; Wiley Eastern Limited: New Delhi, India, 1988.
5. Nishida, I. Phys. Rev. B 1973, 7, 2710.
6. Nishida, I.; Sakata, T. J. Phys. Chem. Solids 1978, 39, 499.
7. Kojima, T. Phys. Status Solldi A 1989, 111, 233.
8. Bass, J. C.; Eisner, N. B. In 3rd International Conference on Thermoelectric Energy Conversion; Rao, K. R., Ed.; IEEE: New York, 1980; p 8.
9. Nakahara, J. F.; Takeshita, T.; Tschetter, M. J.; Beaudry, B. J.; Gschneidner Jr., K. A. J. Appl. Phys. 1988, 63, 2331.
10. Wood, C.; Emin, D. Phys. Rev. B 1984, 29, 4582.
11. Yugo, S.; Sato, T.; Kimura, T. Phys. Lett. 1985, 46, 842.
12. Okinaka, N.; Akiyama, T. In 2005 International Conference on Thermoelectrics; IEEE: New York, 2005; p 34.
13. Cohn, J. L.; Nolas, G. S.; Fessatidis, V.; Metcalf, T. H.; Slack, G. A. Phys. Rev. Lett. 1999, 82, 119.
14. Nolas, G. S. Mater. Res. Soc. Symp. Proc. 1999, 545, 435.
15. Nolas, G. S.; Weakley, T. J. R.; Cohn, J. L.; Sharma, R. Phys. Rev. B 2000, 61, 3845.
16. Sararnata, A.; Svensson, G.; Palmqvist, A. E. C.; Stiewe, C.; Mueller, E.; Platzek, D.; Williams, S. G. K.; Rowe, D. M.; Bryan, J. D.; Stucky, G. D. J. Appl. Phys. 2006, 99, 023708.
17. Mudryk, Y.; Rogl, P.; Paul, C.; Berger, S.; Bauer, E.; Hilscher, G.; Godart, C.; Noel, H.; Saccone, A.; Ferro, R. Physica B 2003, 328, 44.
18. Mudryk, Y.; Rogl, P.; Paul, C.; Berger, S.; Bauer, E.; Hilscher, G.; Godart, C.; Noel, H. J. Phys.: Condens. Matter 2002, 14, 7991.
19. Kuznetsov, V. L.; Kuznetsova, L. A.; Kaliazin, A. E.; Rowe, D. M. 18th International Conference on Thermoelectrics; IEEE: New York, 1999; p 177.
20. Nataraj, D.; Nagao, J.; Ferhat, M.; Ebinuma, T. J. Appl. Phys. 2003, 93, 2424.
21. Nataraj, D.; Nagao, J.; Ferhat, M.; Ebinuma, T.; Anno, H. 21st International Conference on Thermoelectrics; IEEE: New York. 2002; 72.
22. Condron, C. L.; Porter, R.; Guo, T.; Kauzlarich, S. M. Inorg. Chem. 2005, 44, 9185.
23. McCormaek, J. A.; Fleurial, J. P. Mater. Res. Soc. Symp. Proc. 1991, 234, 135.
24. Wood, C; Zoltan, D.; Stapfer, G. Rev. Sci. Instrum. 1985, 56, 719.
25. Bryan, J. D.; Blake, N. P.; Metiu, H.; Stucky, G. D.; Iversen, B. B.; Poulsen, R. D.; Bentien, A. J. Appl. Phys. 2002, 92, 7281.
26. Nolas, G. S.; Cohn, J. L.; Slack, G. A.; Schujman, S. B. Appl. Phys. Lett. 1998, 73, 178.
27. Condron C. L.; Kauzlarich, S. M.; Gascoin, F.; Snyder, G. J. J. Solid State Chem. 2006, 179, 2252.