Applications of focused ion beam for preparation of specimens of ancient ceramic for electron microscopy and synchrotron X-ray studies

Micron

Volumn 40, Issue 5-6, 2009, Pages 597-604

  Sciau, Ph ^a,b   Salles, Ph ^a,b   Roucau, C ^a,b   Mehta, A ^c   Benassayag, G ^a,b  

^a CEMES CNRS   (France)

^b INSA   (France)

^c SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

Ancient pottery; FIB; TEM

Indexed keywords

ACCURATE LOCATION; ANCIENT POTTERY; COMPLEX MATERIALS; COMPLEX STRUCTURE; CRYSTALLOGRAPHIC PHASE; FIB; FIB MILLING; LIFT-OUT TECHNIQUES; MICRODIFFRACTION; NANOMETRE; OUTER SURFACE LAYERS; PRECISE REGISTRATION; SURFACE DECORATION; SYNCHROTRON X RAYS; TEM; TERRA SIGILLATA; XANES;

CERAMIC MATERIALS; DECORATION; DIFFRACTION; HOLOGRAPHIC INTERFEROMETRY; SYNCHROTRONS;

FOCUSED ION BEAMS;

EID: 67349188107     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2009.02.012     Document Type: Article

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