Applications of focused ion beam SIMS in materials science

Microchimica Acta

Volumn 161, Issue 3-4, 2008, Pages 387-397

  McPhail, David S ^a   Chater, Richard J ^a   Li, Libing ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

Depth profiling; Focused ion beam (FIB); imaging; Materials science; Secondary ion mass spectrometry (SIMS)

Indexed keywords

EID: 44449096065     PISSN: 00263672     EISSN: 14365073     Source Type: Journal    
DOI: 10.1007/s00604-007-0913-x     Document Type: Conference Paper

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