Characterization of benzenethiolate self-assembled monolayer on Cu(1 0 0) by XPS and NEXAFS

Journal of Electron Spectroscopy and Related Phenomena

Volumn 172, Issue 1-3, 2009, Pages 64-68

  Beccari, Marco ^a   Kanjilal, Aloke ^b   Betti, Maria Grazia ^c   Mariani, Carlo ^c   Floreano, Luca ^d   Cossaro, Albano ^d   Di Castro, Valeria ^a  

^a SAPIENZA UNIVERSITY OF ROME   (Italy)

^b CNR   (Italy)

^c UNIVERSITÀ DI ROMA LA SAPIENZA   (Italy)

^d LABORATORIO TASC   (Italy)

Author keywords

Benzenethiolate self assembled monolayer (SAM); Copper; Near edge X ray absorption fine structure (NEXAFS); X ray photoelectron spectroscopy (XPS)

Indexed keywords

ADSORBED MOLECULES; BENZENE RING; BENZENETHIOLATE; BENZENETHIOLATE SELF-ASSEMBLED MONOLAYER (SAM); BOND FORMATION; CU(1 0 0); DIPHENYLDISULFIDE; NEAR EDGE X RAY ABSORPTION FINE STRUCTURE; NEAR-EDGE X-RAY ABSORPTION FINE STRUCTURE (NEXAFS); POLARIZATION ANGLE; ROOM TEMPERATURE; SURFACE NORMALS; THIOLATE; X-RAY PHOTOELECTRON SPECTROSCOPY (XPS); XPS;

ABSORPTION; ABSORPTION SPECTROSCOPY; BENZENE; ELECTRON SPECTROSCOPY; ELECTRONIC STRUCTURE; MOLECULAR ORIENTATION; MOLECULAR SPECTROSCOPY; PHOTOELECTRICITY; PHOTOIONIZATION; PHOTONS; SELF ASSEMBLED MONOLAYERS; SPECTRUM ANALYSIS; X RAY ABSORPTION; X RAYS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 67349171010     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2009.03.004     Document Type: Article

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