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Materials Science and Engineering: B

Volumn 159-160, Issue C, 2009, Pages 314-317

Electronic properties of the interface between Si and sputter deposited indium-tin oxide

(4) Monakhov, E V a Balasundaraprabhu, R a Muthukumarasamy, N b Svensson, B G a

a UNIVERSITY OF OSLO (Norway)

b Department of Artificial Intelligence and Machine Learning (India)

Author keywords

Indium tin oxide; Interface; Silicon

Indexed keywords

CAPACITANCE; DEEP LEVEL TRANSIENT SPECTROSCOPY; ELECTRONIC PROPERTIES; HETEROJUNCTIONS; HOLE TRAPS; INDIUM COMPOUNDS; INTERFACE STATES; INTERFACES (MATERIALS); OXIDE FILMS; SILICON COMPOUNDS; THERMIONIC EMISSION; THERMODYNAMIC STABILITY; TIN OXIDES;

CAPACITANCE VOLTAGE MEASUREMENTS; CAPACITANCE-VOLTAGE CHARACTERISTICS; CURRENT-VOLTAGE; DEEP LEVELS TRANSIENT SPECTROSCOPY; INDIUM TIN OXIDE FILMS; INDIUM-TIN OXIDE; INTERFACIAL STATE; MAGNETRON-SPUTTERING; P-TYPE SI; TEMPERATURE RANGE;

ACTIVATION ENERGY;

EID: 67349169956 PISSN: 09215107 EISSN: None Source Type: Journal
DOI: 10.1016/j.mseb.2008.11.023 Document Type: Article

Times cited : (7)

References (12)

1
- 0019589799
- Ashok S., Fonash S.J., Singh R., and Wiley P. IEEE Electron Device Lett. 2 (1981) 184
- (1981) IEEE Electron Device Lett. , vol.2 , pp. 184
- Ashok, S.¹ Fonash, S.J.² Singh, R.³ Wiley, P.⁴

2
- 0026837785
- Subrahmanyam A., and Balasubramanian N. Semicond. Sci. Technol. 7 (1992) 324
- (1992) Semicond. Sci. Technol. , vol.7 , pp. 324
- Subrahmanyam, A.¹ Balasubramanian, N.²

3
- 33751520683
- Kobayashi H., Ishida T., Nakato Y., and Tsubomura H. J. Appl. Phys. 69 (1991) 1736
- (1991) J. Appl. Phys. , vol.69 , pp. 1736
- Kobayashi, H.¹ Ishida, T.² Nakato, Y.³ Tsubomura, H.⁴

4
- 12344283587
- Vasu V., and Subrahmanyam A. Appl. Phys. A 80 (2005) 823
- (2005) Appl. Phys. A , vol.80 , pp. 823
- Vasu, V.¹ Subrahmanyam, A.²

5
- 0017930367
- Shewchun J., Dubow J., Myszkowski A., and Singh R. J. Appl. Phys. 49 (1978) 855
- (1978) J. Appl. Phys. , vol.49 , pp. 855
- Shewchun, J.¹ Dubow, J.² Myszkowski, A.³ Singh, R.⁴

6
- 85165806729
- Kuwano K., and Ashok S. Appl. Surf. Sci. 629 (1997) 117-118
- (1997) Appl. Surf. Sci. , vol.629 , pp. 117-118
- Kuwano, K.¹ Ashok, S.²

7
- 0001683480
- Svensson B.G., Rydén K.-H., and Lewerentz B.M.S. J. Appl. Phys. 66 (1989) 1699
- (1989) J. Appl. Phys. , vol.66 , pp. 1699
- Svensson, B.G.¹ Rydén, K.-H.² Lewerentz, B.M.S.³

8
- 33745444518
- Kurdesau F., Khripunov G., da Cunha A.F., Kaelin M., and Tiwari A.N. J. Non-Cryst. Solids 352 (2006) 1466
- (2006) J. Non-Cryst. Solids , vol.352 , pp. 1466
- Kurdesau, F.¹ Khripunov, G.² da Cunha, A.F.³ Kaelin, M.⁴ Tiwari, A.N.⁵

9
- 33847021888
- Fallah H.R., Ghasemi M., Hassanzadeh A., and Steki H. Mater. Res. Bull. 42 (2007) 487
- (2007) Mater. Res. Bull. , vol.42 , pp. 487
- Fallah, H.R.¹ Ghasemi, M.² Hassanzadeh, A.³ Steki, H.⁴

10
- 0034292449
- George J., and Menon C.S. Surf. Coat. Technol. 132 (2000) 45
- (2000) Surf. Coat. Technol. , vol.132 , pp. 45
- George, J.¹ Menon, C.S.²

11
- 0037415896
- Pla J., Tamasi M., Rizzoli R., Losurdo M., Centurioni E., Summonte C., and Rubinelli F. Thin Solid Films 425 (2003) 185
- (2003) Thin Solid Films , vol.425 , pp. 185
- Pla, J.¹ Tamasi, M.² Rizzoli, R.³ Losurdo, M.⁴ Centurioni, E.⁵ Summonte, C.⁶ Rubinelli, F.⁷

12
- 0000974740
- Ow-Yang C.W., Shigesato Y., and Paine D.C. J. Appl. Phys. 88 (2000) 3717
- (2000) J. Appl. Phys. , vol.88 , pp. 3717
- Ow-Yang, C.W.¹ Shigesato, Y.² Paine, D.C.³

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