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Volumn 80, Issue 4, 2005, Pages 823-827

Carrier transport mechanism in indium tin oxide (ITO)/silicon heterojunctions: Effect of chlorine

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CURRENT VOLTAGE CHARACTERISTICS; DEPOSITION; ELECTRON BEAMS; EVAPORATION; HYDROFLUORIC ACID; INDIUM COMPOUNDS; MATHEMATICAL MODELS; PYROLYSIS; SEMICONDUCTING SILICON; SILICA; THERMIONIC EMISSION;

EID: 12344283587     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-003-2260-z     Document Type: Article
Times cited : (16)

References (37)
  • 37
    • 0018032570 scopus 로고
    • D.L. Pulfrey: IEEE Trans. Elect. Dev. 23, 587 (1976); ibid. 25, 1308 (1978)
    • (1978) IEEE Trans. Elect. Dev. , vol.25 , pp. 1308


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.