Origin of ferromagnetism in iron implanted rutile single crystals

Hyperfine Interactions

Volumn 191, Issue 1-3, 2009, Pages 95-102

  Talut, G ^a   Reuther, H ^a   Grenzer, J ^a   Zhou, S ^a  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

Author keywords

Conversion Electron M ssbauer Spectroscopy (CEMS); Diluted magnetic semiconductor (DMS); Fe doping of Ti oxide; Ion beam implantation

Indexed keywords

EID: 67349153961     PISSN: 03043843     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10751-009-9958-z     Document Type: Article

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