Controlling geometric and electronic properties of highly ordered CuPc thin films

Applied Surface Science

Volumn 255, Issue 15, 2009, Pages 6806-6808

  Toader, T ^a   Gavrila, G ^a,b   Ivanco, J ^a   Braun, W ^b   Zahn, D R T ^a  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

Molecular film growth; Molecular orientation; NEXAFS; Organic semiconductors; Photoemission; Phthalocyanine

Indexed keywords

ELECTRONIC PROPERTIES; FIELD EFFECT TRANSISTORS; FILM GROWTH; MOLECULES; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; SEMICONDUCTING ORGANIC COMPOUNDS; SEMICONDUCTOR GROWTH; THICK FILMS; THIN FILMS; X RAY ABSORPTION;

COPPER PHTHALOCYANINE; MOLECULAR FILMS; NEAR EDGE X RAY ABSORPTION FINE STRUCTURE; NEXAFS; PASSIVATED SURFACE; PHTHALOCYANINE; SI SURFACES; UPRIGHT ORIENTATIONS;

MOLECULAR ORIENTATION;

EID: 67349086892     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.02.078     Document Type: Article

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