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Journal of Applied Physics

Volumn 105, Issue 9, 2009, Pages

"negative resistance" errors in four-point measurements of tunnel junctions and other crossed-wire devices

(2) Pomeroy, J M a Grube, H a

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE; DEVICE RESISTANCE; ELECTRONIC PERFORMANCE; EXPERIMENTAL DATA; EXPERIMENTAL MEASUREMENTS; FINITE-ELEMENT MODELS; FOUR-POINT MEASUREMENTS; IN-SITU; JUNCTION RESISTANCES; NEGATIVE RESISTANCE EFFECT; NONUNIFORM CURRENT DISTRIBUTIONS; PHYSICAL INTERPRETATION; SHADOW MASK; STRAIGHT-FORWARD METHOD; TEMPERATURE DEPENDENT; TRANSPORT MEASUREMENTS;

ERRORS; MAGNETIC FIELD EFFECTS; MAGNETOELECTRONICS; MAGNETORESISTANCE; NEGATIVE RESISTANCE; TEMPERATURE MEASUREMENT; TUNNEL JUNCTIONS;

WIRE;

EID: 67249143917 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3122503 Document Type: Article

Times cited : (19)

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