Dielectric properties of (Na, K)NbO3 thin films for tunable microwave device application

Ferroelectrics

Volumn 356, Issue 1 PART 2, 2007, Pages 166-171

  Kim, Kyoung Tae ^a   Kim, Gwan Ha ^a   Woo, Jong Chang ^a   Kim, Chang Il ^a  

^a Chung Ang University   (South Korea)

Author keywords

NKN; Sol gel; Tunability: dielectric properties

Indexed keywords

ALKOXIDES; DIELECTRIC CONSTANTS; FIELD EMISSION SCANNING ELECTRON MICROSCOPES; NKN THIN FILMS; SCANNING CALORIMETRY; SI SUBSTRATES; SOL-GEL METHODS; STOCK SOLUTIONS; TUNABILITIES; TUNABILITY: DIELECTRIC PROPERTIES; TUNABLE DEVICE; TUNABLE MICROWAVE DEVICES; X-RAY DIFFRACTION SPECTROSCOPY;

DIELECTRIC LOSSES; FERROELECTRICITY; FIELD EMISSION; GELS; MICROWAVE DEVICES; MICROWAVES; SCANNING ELECTRON MICROSCOPY; SINTERING; SODIUM; SOL-GELS; SOLS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

SOL-GEL PROCESS;

EID: 66949162647     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150190701511914     Document Type: Conference Paper

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