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Volumn 94, Issue 21, 2009, Pages

Dynamics of strain relaxation studied by in situ x-ray diffraction immediately after layer heteroepitaxy

Author keywords

[No Author keywords available]

Indexed keywords

DEGREE OF RELAXATION; DENSITY OF DISLOCATION; GAAS; HETEROEPITAXY; HIGH RESOLUTION; IN-SITU; LAYER GROWTH; PLASTIC RELAXATION; TEMPORAL DEVELOPMENT; TIME CONSTANTS;

EID: 66549129840     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3143630     Document Type: Article
Times cited : (4)

References (12)
  • 4
    • 0242509034 scopus 로고    scopus 로고
    • 0031-9007,. 10.1103/PhysRevLett.91.145503
    • K. W. Schwarz, Phys. Rev. Lett. 0031-9007 91, 145503 (2003). 10.1103/PhysRevLett.91.145503
    • (2003) Phys. Rev. Lett. , vol.91 , pp. 145503
    • Schwarz, K.W.1
  • 5
    • 0343973898 scopus 로고
    • 0021-8979,. 10.1063/1.349451
    • D. C. Houghton, J. Appl. Phys. 0021-8979 70, 2136 (1991). 10.1063/1.349451
    • (1991) J. Appl. Phys. , vol.70 , pp. 2136
    • Houghton, D.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.