On the capacitance-boost of ionic polymer metal composites due to electroless plating: Theory and experiments

Journal of Applied Physics

Volumn 105, Issue 10, 2009, Pages

  Aureli, Matteo ^a   Lin, Weiyang ^a   Porfiri, Maurizio ^a  

^a POLYTECHNIC UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE LAYER; CLOSED-FORM EXPRESSION; DEBYE SCREENING LENGTH; DIFFUSE LAYERS; ELECTRIC POTENTIAL DISTRIBUTION; ELECTRICAL BEHAVIORS; ELECTRODE MODELS; ELECTRODE SURFACE AREA; ELECTRODE SURFACE ROUGHNESS; EXPERIMENTAL DATA; FRACTAL ELECTRODES; GEOMETRIC FACTORS; IONIC POLYMER METAL COMPOSITES; LOCAL CURVATURE; MORPHOLOGICAL STUDY; NOMINAL THICKNESS; PER UNIT; PERTURBATION METHOD; POLYMER THICKNESS; POLYMER-ELECTRODE INTERFACE; ROUGH ELECTRODES; STATISTICAL PROPERTIES; SURFACE AREA;

ELECTRIC POTENTIAL; ELECTRODES; ORGANIC CONDUCTORS; PERTURBATION TECHNIQUES; POISSON DISTRIBUTION; POLYMERS; SURFACE ROUGHNESS;

CAPACITANCE;

EID: 66549092265     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3129503     Document Type: Article

References (72)

1. C. Bonomo, L. Fortuna, P. Giannone, S. Graziani, and S. Strazzeri, Smart Mater. Struct. 0964-1726 17, 015014 (2008). 10.1088/0964-1726/17/01/015014
2. C. Bonomo, P. Brunetto, L. Fortuna, P. Giannone, S. Graziani, and S. Strazzeri, IEEE Sens. J. 1530-437X 8, 1486 (2008). 10.1109/JSEN.2008.920723
3. J. Brufau-Penella, M. Puig-Vidal, P. Giannone, S. Graziani, and S. Strazzeri, Smart Mater. Struct. 0964-1726 17, 015009 (2008). 10.1088/0964-1726/17/01/015009
4. S. Guo, T. Fukuda, and K. Asaka, IEEE/ASME Trans. Mechatron. 1083-4435 8, 136 (2003). 10.1109/TMECH.2003.809134
5. E. Mbemmo, Z. Chen, S. Shatara, and X. Tan, Proceedings of the 2008 IEEE International Conference on Robotics and Automation, Pasadena, CA, 19-23 May 2008, pp. 689-694.
6. T. T. Nguyen, N. S. Goo, V. K. Nguyen, Y. Yoo, and S. Park, Sens. Actuators A 141, 640 (2008). 10.1016/j.sna.2007.09.017 0924-4247
7. M. Shahinpoor, Y. Bar-Cohen, J. O. Simpson, and J. Smith, Smart Mater. Struct. 0964-1726 7, R15 (1998). 10.1088/0964-1726/7/6/001
8. M. Shahinpoor and K. J. Kim, Smart Mater. Struct. 0964-1726 13, 1362 (2004). 10.1088/0964-1726/13/6/009
9. G. Del Bufalo, L. Placidi, and M. Porfiri, Smart Mater. Struct. 0964-1726 17, 045010 (2008). 10.1088/0964-1726/17/4/045010
10. K. Oguro, Preparation Procedure Ion-Exchange Polymer Metal Composites (IPMC) Membranes, Osaka National Research Institute, AIST, Japan (http://ndeaa.jpl.nasa.gov/nasa-nde/lommas/eap/IPMC-PrepProcedure.htm).
11. K. Onishi, S. Sewa, K. Asaka, N. Fujiwara, and K. Oguro, Electrochim. Acta 0013-4686 46, 1233 (2001). 10.1016/S0013-4686(00)00695-2
12. S. J. Kim, S. -M. Kim, K. J. Kim, and Y. H. Kim, Smart Mater. Struct. 0964-1726 16, 2286 (2007). 10.1088/0964-1726/16/6/031
13. S. Nemat-Nasser, J. Appl. Phys. 0021-8979 92, 2899 (2002). 10.1063/1.1495888
14. S. Nemat-Nasser, S. Zamani, and Y. Tor, J. Appl. Phys. 0021-8979 99, 104902 (2006). 10.1063/1.2194127
15. M. Shahinpoor, Electrochim. Acta 0013-4686 48, 2343 (2003). 10.1016/S0013-4686(03)00224-X
16. B. J. Akle, T. Wallmersperger, E. Akle, and D. J. Leo, Proc. SPIE 0277-786X 6929, 69290N (2008). 10.1117/12.776451
17. C. Bonomo, L. Fortuna, P. Giannone, and S. Graziani, IEEE Trans. Circuits Syst., I: Regul. Pap. 1549-8328 53, 338 (2006). 10.1109/TCSI.2005.856042
18. P. J. Costa Branco and J. A. Dente, Smart Mater. Struct. 0964-1726 15, 378 (2006). 10.1088/0964-1726/15/2/019
19. J. Paquette, K. Kim, J. -D. Nam, and Y. Tak, J. Intell. Mater. Syst. Struct. 1045-389X 14, 633 (2003). 10.1177/104538903038024
20. M. Porfiri, J. Appl. Phys. 0021-8979 104, 104915 (2008). 10.1063/1.3017467
21. Z. Chen and X. Tan, IEEE/ASME Trans. Mechatron. 1083-4435 13, 519 (2008). 10.1109/TMECH.2008.920021
22. B. J. Akle, D. J. Leo, M. A. Hickner, and J. E. McGrath, J. Mater. Sci. 0022-2461 40, 3715 (2005). 10.1007/s10853-005-3312-x
23. K. Farinholt and D. J. Leo, Mech. Mater. 0167-6636 36, 421 (2004). 10.1016/S0167-6636(03)00069-3
24. M. Porfiri, C. Maurini, and J. Pouget, Smart Mater. Struct. 0964-1726 16, 323 (2007). 10.1088/0964-1726/16/2/010
25. M. Porfiri, Smart Mater. Struct. 0964-1726 18, 015016 (2009). 10.1088/0964-1726/18/1/015016
26. T. Wallmersperger, B. J. Akle, D. J. Leo, and B. Kroplin, Compos. Sci. Technol. 0266-3538 68, 1173 (2008). 10.1016/j.compscitech.2007.06.001
27. A. J. Bard and L. R. Faulkner, Electrochemical Methods: Fundamentals and Applications (Wiley, Hoboken, NJ, 2001).
28. S. Nemat-Nasser and Y. Wu, J. Appl. Phys. 0021-8979 93, 5255 (2003). 10.1063/1.1563300
29. T. Wallmersperger, B. Kroplin, and R. W. Gulch, Mech. Mater. 0167-6636 36, 411 (2004). 10.1016/S0167-6636(03)00068-1
30. T. Wallmersperger, D. J. Leo, and C. S. Kothera, J. Appl. Phys. 0021-8979 101, 024912 (2007). 10.1063/1.2409362
31. N. Abaid, R. S. Eisenberg, and W. Liu, SIAM J. Appl. Dyn. Syst. 1536-0040 7, 1507 (2008). 10.1137/070691322
32. M. Z. Bazant, K. Thornton, and A. Ajdari, Phys. Rev. E 1063-651X 70, 021506 (2004). 10.1103/PhysRevE.70.021506
33. B. Eisenberg and W. Liu, SIAM J. Appl. Math. 0036-1399 38, 1932 (2007). 10.1137/060657480
34. M. Porfiri, Phys. Rev. E 1063-651X 79, 041503 (2009). 10.1103/PhysRevE.79.041503
35. L. I. Daikhin, A. A. Kornyshev, and M. Urbakh, Phys. Rev. E 1063-651X 53, 6192 (1996). 10.1103/PhysRevE.53.6192
36. M. S. Kilic, M. Z. Bazant, and A. Ajdari, Phys. Rev. E 1063-651X 75, 021502 (2007). 10.1103/PhysRevE.75.021502
37. M. S. Kilic, M. Z. Bazant, and A. Ajdari, Phys. Rev. E 1063-651X 75, 021503 (2007). 10.1103/PhysRevE.75.021503
38. M. Z. Bazant, K. T. Chu, and B. J. Bayly, SIAM J. Appl. Math. 0036-1399 65, 1463 (2005). 10.1137/040609938
39. P. Schaetzel and B. Auclair, Electrochim. Acta 0013-4686 43, 3375 (1998). 10.1016/S0013-4686(98)00067-X
40. J. Fimrite, H. Struchtrup, and N. Djilali, J. Electrochem. Soc. 0013-4651 152, A1804 (2005). 10.1149/1.1952627
41. S. Nemat-Nasser and J. Y. Li, J. Appl. Phys. 0021-8979 87, 3321 (2000). 10.1063/1.372343
42. S. Nemat-Nasser and Y. Wu, Proc. SPIE 0277-786X 5051, 245-253 (2003). 10.1117/12.484439
43. S. Nemat-Nasser and S. Zamani, J. Appl. Phys. 0021-8979 100, 064310 (2006). 10.1063/1.2221505
44. J. W. Paquette, K. J. Kim, and D. Kim, Sens. Actuators, A 0924-4247 118, 135 (2005). 10.1016/S0924-4247(04)00541-2
45. K. Farinholt and D. J. Leo, J. Appl. Phys. 0021-8979 104, 014512 (2008). 10.1063/1.2952974
46. A. H. Nayfeh, Introduction to Perturbation Techniques (Wiley-Interscience, New York, 1981).
47. L. I. Daikhin, A. A. Kornyshev, and M. Urbakh, J. Chem. Phys. 0021-9606 108, 1715 (1998). 10.1063/1.475543
48. Y. -P. Zhao, G. -C. Wang, T. -M. Lu, G. Palasantzas, and J. T. M. De Hosson, Phys. Rev. B 0163-1829 60, 9157 (1999). 10.1103/PhysRevB.60.9157
49. A. Papoulis and S. U. Pillai, Probability, Random Variables and Stochastic Processes, 4th ed. (McGraw-Hill, New York, 2002).
50. B. Stoimenov, J. Rossiter, and T. Mukai, Proc. SPIE 0277-786X 6413, 641302.1-641302.10 (2007). 10.1117/12.695665
51. B. Stoimenov, J. Rossiter, and T. Mukai, Proc. SPIE 0277-786X 6524, 65240T.1-65240T. 11 (2007). 10.1117/12.715560
52. G. Palasantzas and G. M. E. A. Backx, J. Appl. Phys. 0021-8979 92, 7175 (2002). 10.1063/1.1519952
53. B. J. Akle, M. D. Bennet, D. J. Leo, K. B. Wiles, and J. E. McGrath, J. Mater. Sci. 0022-2461 42, 7031 (2007). 10.1007/s10853-006-0632-4
54. K. J. Kim and M. Shahinpoor, Polymer 0032-3861 43, 797 (2002). 10.1016/S0032-3861(01)00648-6
55. K. J. Kim and M. Shahinpoor, Smart Mater. Struct. 0964-1726 12, 65 (2003). 10.1088/0964-1726/12/1/308
56. D. Y. Lee, I. -S. Park, M. -H. Lee, K. J. Kim, and S. Heob, Sens. Actuators, A 0924-4247 133, 117 (2007). 10.1016/j.sna.2006.04.005
57. B. J. Akle and D. J. Leo, J. Intell. Mater. Syst. Struct. 1045-389X 19, 905 (2008). 10.1177/1045389X07082441
58. S. Nemat-Nasser and Y. Wu, Smart Mater. Struct. 0964-1726 15, 909 (2006). 10.1088/0964-1726/15/4/003
59. M. Bennett and D. J. Leo, Sens. Actuators A 115, 79 (2004). 10.1016/j.sna.2004.03.043 0924-4247
60. M. D. Bennett, D. J. Leo, G. L. Wilkes, F. L. Beyer, and T. W. Pechar, Polymer 0032-3861 47, 6782 (2006). 10.1016/j.polymer.2006.07.061
61. S. Torquato, Random Heterogeneous Materials (Springer, New York, 2002).
62. R. C. McPhedran and D. R. McKenzie, Proc. R. Soc. London, Ser. A 0950-1207 359, 45 (1978). 10.1098/rspa.1978.0031
63. G. Barbero, J. J. da Silva, and A. M. Figueiredo Neto, J. Appl. Phys. 0021-8979 101, 113705 (2007). 10.1063/1.2737774
64. H. Sakaguchi and R. Baba, Phys. Rev. E 1063-651X 75, 051502 (2007). 10.1103/PhysRevE.75.051502
65. H. Sakaguchi and R. Baba, Phys. Rev. E 1063-651X 76, 011501 (2007). 10.1103/PhysRevE.76.011501
66. T. C. Halsey and M. Leibig, Phys. Rev. A 1050-2947 43, 7087 (1991). 10.1103/PhysRevA.43.7087
67. R. Kant and S. K. Rangajaran, J. Electroanal. Chem. 0022-0728 552, 141 (2003). 10.1016/S0022-0728(03)00039-1
68. D. Kim and K. J. Kim, J. Intell. Mater. Syst. Struct. 1045-389X 17, 449 (2006). 10.1177/1045389X06058871
69. Z. Chen, D. Hedgepeth, and X. Tan, Proceedings of the 47th IEEE Conference on Decision and Control, Cancun, Mexico, 9-11 December 2008, pp. 1851-1856.
70. X. Bao, Y. Bar-Cohen, and S. -S. Lih, Proc. SPIE 0277-786X 4695, 220-227 (2002). 10.1117/12.475167
71. L. I. Daikhin, A. A. Kornyshev, and M. Urbakh, Electrochim. Acta 0013-4686 42, 2853 (1997). 10.1016/S0013-4686(97)00106-0
72. G. Palasantzas, J. Appl. Phys. 0021-8979 98, 034505 (2005). 10.1063/1.2005376