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Volumn 48, Issue 11, 2001, Pages 2640-2646

Self-heating effect compensation in HBTs and its analysis and simulation

Author keywords

Feedback; HBT; Semiconductor device modeling; Semiconductor device thermal factors; Temperature

Indexed keywords

COMPUTER SIMULATION; FEEDBACK; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE TESTING; THERMAL EFFECTS;

EID: 6644223785     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.960390     Document Type: Article
Times cited : (24)

References (16)
  • 10
    • 0001974214 scopus 로고
    • Voltage feedback and thermal resistance in junction transistors
    • (1958) Proc. IRE , vol.46 , pp. 1305-1306
    • Sparkes1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.