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Volumn 44, Issue 11, 1996, Pages 2001-2009

A new large signal HBT model

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED NETWORK ANALYSIS; COMPUTER SIMULATION; MICROWAVE INTEGRATED CIRCUITS; PARAMETER ESTIMATION;

EID: 0030285560     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.543955     Document Type: Article
Times cited : (35)

References (10)
  • 1
    • 0014780722 scopus 로고    scopus 로고
    • "An integral charge control model of bipolar transistors," Bell Sys
    • vol. 49, p. 827, 1970.
    • H. K. Gummel et al., "An integral charge control model of bipolar transistors," Bell Sys. Tech. J., vol. 49, p. 827, 1970.
    • Tech. J.
    • Gummel, H.K.1
  • 2
    • 0026836812 scopus 로고    scopus 로고
    • "Large signal modeling of HBT's including self-heating and transit time effects,"
    • vol. 40, 1992, p. 449.
    • P. C. Grossman et al., "Large signal modeling of HBT's including self-heating and transit time effects," IEEE Trans. Microwave Theory Tech., vol. 40, 1992, p. 449.
    • IEEE Trans. Microwave Theory Tech.
    • Grossman, P.C.1
  • 3
    • 33747352654 scopus 로고    scopus 로고
    • "Modeling of self-heating in GaAs/AlGaAs HBT's for accurate circuit and device analysis,"
    • p. 12.1, 1991.
    • P. Baureis et al., "Modeling of self-heating in GaAs/AlGaAs HBT's for accurate circuit and device analysis," GaAs Ic Symp., p. 12.1, 1991.
    • GaAs Ic Symp.
    • Baureis, P.1
  • 4
    • 33747359799 scopus 로고    scopus 로고
    • "A complete and consistent electrical/thermal HBT model,"
    • Oct. 1992, p. 200.
    • C. McAndrew, "A complete and consistent electrical/thermal HBT model," IEEE Bipolar Circ. Tech. Meet., Oct. 1992, p. 200.
    • IEEE Bipolar Circ. Tech. Meet.
    • McAndrew, C.1
  • 5
    • 0027808079 scopus 로고    scopus 로고
    • "Current transport mechanism in GaInP/GaAs heterojunction bipolar transistors,"
    • vol. 40, 1993, p. 1378.
    • W. Liu et al., "Current transport mechanism in GaInP/GaAs heterojunction bipolar transistors," IEEE Trans. Electron Dev., vol. 40, 1993, p. 1378.
    • IEEE Trans. Electron Dev.
    • Liu, W.1
  • 8
    • 0026941833 scopus 로고    scopus 로고
    • "CW measurement of HBT thermal resistance,"
    • vol. 39, 1992, p. 2235.
    • D. E. Dawson et al., "CW measurement of HBT thermal resistance," IEEE Trans. Electron Dev., vol. 39, 1992, p. 2235.
    • IEEE Trans. Electron Dev.
    • Dawson, D.E.1
  • 10
    • 33747338553 scopus 로고    scopus 로고
    • "A manufacturable process for HBT circuits," Proc. 20th Int
    • T. Lester et al., "A manufacturable process for HBT circuits," Proc. 20th Int. Sy. GaAs Related Compounds, 1993.
    • Sy. GaAs Related Compounds, 1993.
    • Lester, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.