The University of New Mexico/Sandia National Laboratories small-angle scattering laboratory

Review of Scientific Instruments

Volumn 69, Issue 10, 1998, Pages 3504-3509

  Rieker, Thomas P ^a   Hubbard, Paul F ^a  

^a MSC01 1070   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATION; COMPUTER HARDWARE; COMPUTER SOFTWARE; DATA REDUCTION; OPTICAL VARIABLES MEASUREMENT; PERFORMANCE; PHOTODETECTORS; SPECTROMETERS; SYSTEMS ANALYSIS;

BONSE-HART SPECTROMETER; SMALL ANGLE SCATTERING LABORATORY;

LIGHT SCATTERING;

EID: 0032185295     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149128     Document Type: Article

References (18)

1. A commercial Bonse-Hart instrument produced by American Metals Research Co., Burlington, MA.
2. A. Hanprasopwattana, T. Rieker, A. Sault, and A. Datye, Catal. Lett. 45, 165 (1997).
3. T. Rieker, A. Hanprasopwattana, P. Hubbard, and A. Datye, Langmuir (submitted).
4. F. Ehrburger-Dolle, T. P. Rieker, M. T. Gonzalez, M. Molina-Sabio, F. Rodriguez-Reinoso, P. Pfeifer, and P. W. Schmidt, in Fractals and Chaos in Chemical Engineering, edited by M. Giona and G. Biard (World Scientific, Singapore, 1996), p. 27.
5. U. Bonse and M. Hart, Appl. Phys. Lett. 7, 238 (1965).
6. U. Bonse and M. Hart, in Small-Angle X-ray Scattering, edited by H. Brumberger (Gordon and Breach, New York, 1965), p. 1211.
7. J. Lambard and T. Zemb, J. Appl. Crystallogr. 24, 555 (1991).
8. G. G. Long, P. R. Jemian, J. R. Weertman, D. R. Black, H. E. Burdette, and R. Spal, J. Appl. Crystallogr. 24, 30 (1991).
9. T. Konishi, E. Yamahara, T. Furuta, and N. Ise, J. Appl. Crystallogr. 30, 854 (1997).
10. R. W. Hendricks, J. Appl. Crystallogr. 11, 15 (1978).
11. K. Ibel, J. Appl. Crystallogr. 9, 296 (1976).
12. P. A. Seeger and R. P. Hjelm, J. Appl. Crystallogr. 24, 467 (1991).
13. G. D. Wignall, J. S. Lin, and S. Spooner, J. Appl. Crystallogr. 23, 241 (1990).
14. R. Jenkins, R. W. Gould, and D. Geddcke, Quantitative X-ray Spectrometry (Marcel Dekker, New York, 1981).
15. J. A. Lake, Acta Crystallogr. 23, 191 (1967).
16. P. Jemian, National Institute of Standards and Technology, Lake.FOR, see, http://www.uni.aps.anl.gov/∼jemian/pete/sas.html (1990).
17. J. R. Taylor, An Introduction to Error Analysis: The Study of Uncertainty in Physical Measurements (University Science Books, Mill Valley, CA, 1982).
18. Manufactured by CPG Inc., 32 Pier Lane West, Fairfield, NJ 07006.