Universality of bias- and temperature-induced dephasing in ballistic electronic interferometers

Physical Review B - Condensed Matter and Materials Physics

Volumn 79, Issue 16, 2009, Pages

  Yamauchi, Y ^a   Hashisaka, M ^a   Nakamura, S ^a   Chida, K ^a   Kasai, S ^a   Ono, T ^a   Leturcq, R ^b   Ensslin, K ^c   Driscoll, D C ^d   Gossard, A C ^d   Kobayashi, K ^a  

^a KYOTO UNIVERSITY   (Japan)

^b INSTITUT D ELECTRONIQUE   (France)

^c ETH ZURICH   (Switzerland)

^d University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 66149180693     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.79.161306     Document Type: Article

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