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Volumn 78, Issue 7, 2008, Pages

Edge-channel interference controlled by Landau level filling

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EID: 49249128801     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.075303     Document Type: Article
Times cited : (83)

References (19)
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    • The uppermost trace in Fig. 4 was measured with back gate voltage of -25 V, corresponding to a reduced electron density.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.