Growth and structure properties of La1-xSrxMnO3-σ (x=0.2, 0.3, 0.45) thin film grown on SrTiO3 (0 0 1) single-crystal substrate by laser molecular beam epitaxy

Journal of Crystal Growth

Volumn 311, Issue 12, 2009, Pages 3289-3294

  Yang, Z ^a   Sun, L ^b   Ke, C ^a   Chen, X ^a   Zhu, W ^a   Tan, O ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

A1. High resolution X ray diffraction; A1. Stresses; A3. Atomic layer epitaxy; A3. Laser epitaxy; B1. Manganites; B1. Perovskites

Indexed keywords

A1. HIGH RESOLUTION X-RAY DIFFRACTION; A1. STRESSES; A3. ATOMIC LAYER EPITAXY; A3. LASER EPITAXY; B1. MANGANITES; B1. PEROVSKITES;

ATOMS; CRYSTAL GROWTH; CRYSTAL STRUCTURE; DIFFRACTION; EPITAXIAL FILMS; LANTHANUM; LASERS; MANGANESE COMPOUNDS; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; MOLECULAR DYNAMICS; OXIDE MINERALS; OXYGEN; PEROVSKITE; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEMICONDUCTOR QUANTUM WIRES; STRONTIUM; STRONTIUM ALLOYS; SUBSTRATES; SURFACE RELAXATION; TWO DIMENSIONAL; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

EPITAXIAL GROWTH;

EID: 66049155806     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2009.03.039     Document Type: Article

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