Structural and optical properties of rock-salt Cd1 - xZnxO thin films prepared by thermal decomposition of electrodeposited Cd1 - xZnxO2

Thin Solid Films

Volumn 517, Issue 19, 2009, Pages 5653-5657

  Han, Xiaofei ^a   Liu, Run ^a,b   Xu, Zhude ^a  

^a ZHEJIANG UNIVERSITY   (China)

^b State Key Laboratory Base of Novel Functional Materials and Preparation Science   (China)

Author keywords

Cadmium oxide; Electrodeposition; Optical properties; Structural properties; Thin films; X ray diffraction; Zinc oxides

Indexed keywords

AQUEOUS SOLUTIONS; BAND GAPS; CADMIUM OXIDE; CRYSTAL LATTICE PARAMETER; NANOCRYSTALLINE THIN FILMS; OPTICAL TRANSMISSIONS; ROCK SALT; ROCK-SALT STRUCTURE; ROOM TEMPERATURE; STRUCTURAL AND OPTICAL PROPERTIES; THERMAL DECOMPOSITIONS; ZN CONTENT; ZN IONS;

CADMIUM; CADMIUM COMPOUNDS; CORROSION; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRODEPOSITION; OPTICAL PROPERTIES; OXIDE FILMS; PHOTORESISTS; PYROLYSIS; STRUCTURAL PROPERTIES; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC; ZINC OXIDE;

OPTICAL FILMS;

EID: 66049085127     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.02.049     Document Type: Article

References (21)

1. Kong K.Y., Ding Y., Yang R., and Wang Z.L. Science 303 (2004) 1348
2. Jayakrishnan R., and Hodes G. Thin Solid Films 440 (2003) 19
3. Coutts T.J., Young D.L., and Li X.N. Mater. Res. Bull. 25 (2000) 58
4. Carballeda-Galicia D.M., Castanedo-Perez R., Jimenez-Sandoval O., Jimenez-Sandoval S., Torres-Delgado G., and Zuniga-Romero C.I. Thin Solid Films 371 (2001) 105
5. Wang F.Z., Ye Z.Z., Ma D.W., Zhu L.P., Zhuge F., and He H.P. Appl. Phys.Lett. 87 (2005) 143101
6. Makino T., Segawa Y., Kawasaki M., Ohtomo A., Shiroki R., Tamura K., Yasuda T., and Koinuma H. Appl. Phys. Lett. 78 (2001) 1237
7. Sadofev S., Schafer P., Fan Y.H., Blumstengel S., Henneberger F., Schulz D., and Klimm D. Appl. Phys.Lett. 91 (2008) 201923
8. Gruber T., Kirchner C., Kling R., Reuss F., Waag A., Bertram F., Forster D., Christen J., and Schreck M. Appl. Phys.Lett. 83 (2003) 3290
9. Choi Y.S., Lee C.G., and Cho S.M. Thin Solid Films 289 (1996) 153
10. Yogeeswaran G., Chenthamarakshan C.R., Seshadri A., de Tacconi N.R., and Rajeshwar K. Thin Solid Films 515 (2006) 2464
11. Tortosa M., Mollar M., and Mari B. J. Cryst. Growth, 304 (2007) 97
12. Switzer J.A. Am. Ceram. Soc. Bull. 66 (1987) 1521
13. Therese G.H.A., and Kamath P.V. Chem. Mater. 12 (2000) 1195
14. Chang S.T., Leu I.C., and Hon M.H. Electrochem. Solid State Lett. 5 (2002) C71
15. Pauporte T., Coux A., Kahn-Harari A., de Tacconi N., Chenthamarakshan C.R., Rajeshwar K., and Lincot D. J. Phys. Chem of Solids 64 (2003) 1737
16. Switzer J.A., Kothari H.M., Poizot P., Nakanishi S., and Bohannan E.W. Nature 425 (2003) 490
17. Liu R., Kulp E.A., Oba F., Bohannan E.W., Ernst F., and Switzer J.A. Chem. Mater. 17 (2005) 725
18. Han X.F., Liu R., Xu Z.D., Chen W.X., and Zheng Y.F. Electrochem. Commun. 7 (2005) 1195
19. Han X.F., Liu R., Chen W.X., and Xu Z.D. Thin Solid Films 516 (2008) 4025
20. The assignments of product phase were based on the Joint Committee for Powder Diffraction Studies (JCPDS) Database-International Center for Diffraction Data 1999, PCPDFWIN v.2.02.
21. Van Vechten J.A., and Bergstresser T.K. Phys. Rev. B 1 (1970) 3351