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Volumn , Issue , 2009, Pages 23-26

Epitaxial silicon microshell vacuum-encapsulated cmos-compatible 200 mhz bulk-mode resonator

Author keywords

[No Author keywords available]

Indexed keywords

BULK-MODE; CMOS COMPATIBLE; ENCAPSULATED RESONATORS; EPITAXIAL SILICON; LOCAL OSCILLATORS; QUALITY FACTORS; RESONANT FREQUENCIES; RF-MEMS;

EID: 65949093325     PISSN: 10846999     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MEMSYS.2009.4805309     Document Type: Conference Paper
Times cited : (6)

References (13)
  • 7
    • 0142165226 scopus 로고    scopus 로고
    • "Single wafer encapsulation of MEMS devices,"
    • R. Candler et al, "Single wafer encapsulation of MEMS devices," IEEE Trans. on Advanced Packaging 26(3) pp. 227-232, 2003
    • (2003) IEEE Trans. on Advanced Packaging , vol.2 , Issue.3 , pp. 227-232
    • Candler, R.1
  • 9
    • 34250632859 scopus 로고    scopus 로고
    • "Temperature-compensated highstability silicon resonators,"
    • R. Melamud, et al, "Temperature-compensated highstability silicon resonators," Applied Physics Letters, 90 244107, 2007
    • (2007) Applied Physics Letters , vol.90 , pp. 244107
    • Melamud1
  • 11
    • 65949089776 scopus 로고    scopus 로고
    • "Performance evaluation and equivalent model of silicon interconnects for fully-encapsulated F MEMS devices ,"
    • In press
    • K-L Chen, J. Silvia et al, "Performance Evaluation and Equivalent Model of Silicon Interconnects for Fully-Encapsulated RF MEMS Devices ," IEEE Trans. on Advanced Packaging, 2008, In press.
    • (2008) IEEE Trans. on Advanced Packaging
    • Chen, K.-L.1    Silvia, J.2
  • 12
    • 79955996608 scopus 로고    scopus 로고
    • Balanced electronic detection of displacement in nanoelectromechanical systems
    • DOI 10.1063/1.1507833
    • K. Ekinci, M. Roukes et al, "Balanced electronic detection of displacement in nanoelectromechanical systems," Applied Physics Letters 81 2253, 2002 (Pubitemid 35166488)
    • (2002) Applied Physics Letters , vol.81 , Issue.12 , pp. 2253
    • Ekinci, K.L.1    Yang, Y.T.2    Huang, X.M.H.3    Roukes, M.L.4
  • 13
    • 65949092478 scopus 로고    scopus 로고
    • "Reducing the effect of parasitic capacitance on MEMS measurements,"
    • P. Rantakari et al, "Reducing the effect of parasitic capacitance on MEMS measurements," Transducer, pp. 1556-1559, 2001
    • (2001) Transducer , pp. 1556-1559
    • Rantakari, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.