3D tomographic analysis of crack morphologies in alumina and glass using FIB microscopy

Journal of Physics: Conference Series

Volumn 126, Issue , 2008, Pages

  Elfallagh, F A ^a   Inkson, B J ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 65649105846     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/126/1/012080     Document Type: Article

References (14)

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