Uncertainty analysis of impedance measurements using DSP implemented ellipse fitting algorithms

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn , Issue , 2008, Pages 463-467

  Ramos, Pedro M ^a,b   Janeiro, Fernando M ^a,c   Tlemanii, Mouhaydine ^c   Serra, A Cruz ^a,b  

^a INSTITUTO DE TELECOMUNICAÇÕES   (Portugal)

^b INSTITUTO SUPERIOR TÉCNICO   (Portugal)

^c UNIVERSITY OF ÉVORA   (Portugal)

Author keywords

Digital signalprocessor; Ellipse fitting algorithm; Experimental uncertainty analysis; Impedance measurements

Indexed keywords

COMPUTER NETWORKS; DATA STORAGE EQUIPMENT; DIGITAL SIGNAL PROCESSORS; DISTANCE MEASUREMENT; ELECTRIC IMPEDANCE MEASUREMENT; MEASUREMENT THEORY; SIGNAL PROCESSING;

DIGITAL SIGNALPROCESSOR; ELLIPSE FITTING ALGORITHM; EXPERIMENTAL UNCERTAINTY ANALYSIS; IMPEDANCE MEASUREMENTS;

UNCERTAINTY ANALYSIS;

EID: 51349161627     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2008.4547080     Document Type: Conference Paper

References (14)

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