Localized thermal analysis: From the micro- To the nanoscale

American Laboratory

Volumn 39, Issue 20, 2007, Pages

  Meyers, Gregory ^a   Pastzor Jr , Andrew ^b   Kjoller, Kevin ^c  

^a DOW CHEMICAL COMPANY   (United States)

^b Dow Analytical Sciences Laboratory

^c Anasys Instruments   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HEATING; INFORMATION ANALYSIS; PROBLEM SOLVING;

LOCALIZED THERMAL ANALYSIS; THERMAL RESPONSE;

THERMOANALYSIS;

EID: 38149078935     PISSN: 00447749     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (12)

1. Hammiche, A.; Reading, M.; Pollock, H.M.; Song, M.; Hourston, D.J. Localised thermal analysis using a miniaturised resistive probe. Rev. Sci. Instr. 1996, 67, 4268-74.
2. King, W.P.; Kenny, T.; Goodson, K.; Cross, G.; Despont, M.; Durig, U.; Rothuizen, H.; Binning, G.; Vettiger, P. Atomic force microscope cantilevers for combined thermomechanical data writing and reading. AppL Phys. Lett. 2001, 78, 1300-2.
3. Dinwiddie, R.B.; Pylkki, R.J.; West, P.E. Thermal conductivity contrast imaging with a scanning thermal microscope. Tong, T.W, ed.; Thermal Conductivity 22, Technomics: Lancaster, PA, 1994; pp 668-77.
4. Harding, L.; King, W.P.; Craig, D.Q.M.; Reading, M. Nanoscak imaging of partially amorphous materials using local thermomechanical analysis and heated tip pulsed force mode AFM. Pharm. Res. (inpress), 2007.
5. Nelson, B.A.; King, W.P. Thermal analysis with nanoscale spatial resolution using heated probe tips. Review of Scientific Instruments (republished on-line in Virtual Journal of Nanoscience & Nanotechnohgy 2007, 15), 73, 23,702, 2007.
6. Nelson, B.A.; King, W.P. Temperature calibration of heated silicon atomic force microscope cantilevers. Sensors and Actuators A 2007, 140, 51-9.
7. Germinario, L. Nano thermal analysis of polymers, thin films and coatings. Invited paper, presented at Microscopy and Microanalysis Conference, Fon Lauderdale, FL, Aug 5, 2007.
8. Fagerburg, D.R. Weathering of polyester and copolyester sheeting. Presented at Atlas School of Natural and Accelerated Weathering, Miami, FL, Apr 28, 1999.
9. Ye, J.; Awatani, T. Raman spectroscopy resolution limitations overcome by nanoscale thermal analysis. Paper presented at Seeing at the Nanoscale Conference, Santa Barbara, CA, June 2007.
10. Wang, H.; Composto, R.J. Wetting and phase separation in polymer blend films: identification of four thickness regimes with distinct morphological pathways, Interface Sci. 2003, 11, 273.
11. Kressler, J.; Schäfer, R.; Thomann, R. Imaging of semicrystalline polymers and polymer blends by FT-IR microspectroscopy, Appl. Spectrosc. 1998, 52(10), 1269.
12. Gotzen, N.; Van Assche, G. Nano-Thermal Analysis - Application to Polymer Blends. GIT Imaging and Microscopy, Apr 2007.