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Volumn 94, Issue 16, 2009, Pages

Sharp emission from single InAs quantum dots grown on vicinal GaAs surfaces

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED-EXCITON TRANSITIONS; CRITICAL THICKNESS; EXCITON FINE STRUCTURES; EXCITON LIFETIMES; GAAS SURFACES; GAAS(001); INAS; INAS QUANTUM DOTS; LIFETIME MEASUREMENTS; OPTICAL STUDIES; POLARIZATION MEASUREMENTS; QUANTUM DOTS; SHARP EMISSIONS;

EID: 65449156428     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3125430     Document Type: Article
Times cited : (10)

References (23)
  • 14
    • 33845221259 scopus 로고    scopus 로고
    • 0021-8979,. 10.1063/1.2384775
    • S. Liang, H. L. Zhu, and W. Wang, J. Appl. Phys. 0021-8979 100, 103503 (2006). 10.1063/1.2384775
    • (2006) J. Appl. Phys. , vol.100 , pp. 103503
    • Liang, S.1    Zhu, H.L.2    Wang, W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.