Electrical characterization of InAs thin films

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 5, Issue 2, 2008, Pages 620-622

  Botha, L ^a   Shamba, P ^a   Botha, J R ^a  

^a NELSON MANDELA METROPOLITAN UNIVERSITY   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVITY DATA; DATA ANALYSIS; ELECTRICAL CHARACTERIZATION; ELECTRICAL PROPERTY; HALL COEFFICIENT; HALL MEASUREMENTS; HOLE MOBILITY RATIO; INAS; INTERFACE CHARGE; N-DOPED; P-TYPE; PARALLEL CONDUCTION; SIMPLIFIED ANALYSIS; SINGLE BAND; SURFACE LAYERS; TWO LAYER MODEL;

CARRIER CONCENTRATION; DATA HANDLING; ELECTRIC PROPERTIES; GALVANOMAGNETIC EFFECTS; HALL MOBILITY; HOLE MOBILITY; PHOSPHORUS; THIN FILMS;

SEMICONDUCTING INDIUM;

EID: 65449145696     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200776810     Document Type: Conference Paper

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