SCOPUS 정보 검색 플랫폼

Volumn 80, Issue 4, 2009, Pages

A smart microfour-point probe with ultrasharp in-plane tips

Author keywords

[No Author keywords available]

Indexed keywords

A THERMALS; FUNCTIONALIZATION; IN PLANES; MICRO-FOUR-POINT PROBES; SQUARE FRAMES;

ATOMIC FORCE MICROSCOPY; NANOCANTILEVERS; PROBES;

PUMPING PLANTS;

EID: 65449129621 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3100182 Document Type: Article

Times cited : (9)

References (9)

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