Identification of trends in process measurements using the wavelet transform

Computers and Chemical Engineering

Volumn 22, Issue SUPPL.1, 1998, Pages

  Flehmig, F ^a   Watzdorf, R V ^a   Marquardt, W ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000900254     PISSN: 00981354     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0098-1354(98)00092-1     Document Type: Article

References (9)

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4. I. Daubechies. Ten Lectures on Wavelets. SIAM, Philadelphia. Penn., 1992.
5. D. L. Donoho and I. M. Johnstone. Ideal spatial adaptation via wavelet shrinkage. Biometrika. 81:425-455, 1994.
6. D. L. Donoho, I. M. Johnstone, G. Kerkyacharian, and D. Picard. Wavelet shrinkage: Asymptopia? Journal of the Royal Statistical Society, Series B, 57:301-369, 1995.
7. A. Kunoth. Computing refinable Integrals - Documentation of the Program. Texas A&M Preprint, 1995.
8. S. Mallat and S. Zhong. Characterization of signals from multiscale edges. IEEE Transactions on Pattern Analysis and Machine Intelligence, 14(7):710 - 732, 1992.
9. S.G. Mallat. A theory for multiresolution signal decomposition: The wavelet representation. IEEE Trans. Pattern Anal. Machine Intel., 11(7):674-693, 1989.