Residual stress and strain-free lattice-parameter depth profiles in a γ-fe4n1-x layer on an α-fe substrate measured by x-ray diffraction stress analysis at constant information depth

Journal of Materials Research

Volumn 24, Issue 4, 2009, Pages 1342-1352

  Wohlschlogel M ^a   Welzel, U ^a   Mittemeijer, E J ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONCENTRATION-DEPTH PROFILES; CONSTANT PENETRATIONS; DEPTH PROFILES; GRAIN INTERACTIONS; INFORMATION DEPTHS; LATTICE PARAMETERS; LATTICE SPACINGS; LATTICE STRAINS; LOCAL THERMODYNAMIC EQUILIBRIUMS; NITROGEN CONCENTRATIONS; PENETRATION DEPTHS; STRAIN-FREE; STRESS AND STRAINS; X- RAY DIFFRACTIONS; X-RAY ELASTIC CONSTANTS;

DIFFRACTION; ELASTIC CONSTANTS; LATTICE CONSTANTS; NITROGEN; REFLECTION; RESIDUAL STRESSES; STRAIN; STRENGTH OF MATERIALS; STRESS ANALYSIS; X RAY DIFFRACTION;

X RAY DIFFRACTION ANALYSIS;

EID: 65349125968     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2009.0153     Document Type: Article

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