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Volumn 311, Issue 9, 2009, Pages 2753-2758

The role of lattice misfit strains in the deposition of epitaxial (Ba1-ySry)Ti0.5Nb0.5O3 films

Author keywords

A1. Interfaces; A1. Strain; A3. Epitaxial; A3. Thin film; B1. Niobium doped BaTiO3; B2. Conductive oxide

Indexed keywords

A1. INTERFACES; A1. STRAIN; A3. EPITAXIAL; A3. THIN FILM; B1. NIOBIUM-DOPED BATIO3; B2. CONDUCTIVE OXIDE;

EID: 65349104483     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2009.03.008     Document Type: Article
Times cited : (1)

References (16)
  • 14
    • 65349142180 scopus 로고    scopus 로고
    • General Area Detector Diffraction System (GADDS) User's Manual, Bruker Analytical X-ray Systems.
    • General Area Detector Diffraction System (GADDS) User's Manual, Bruker Analytical X-ray Systems.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.