The ultimate strength of glass silica nanowires

Nano Letters

Volumn 9, Issue 2, 2009, Pages 831-835

  Brambilla, Gilberto ^a   Payne, David N ^a  

^a UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; DEFECTS; GLASS; SCANNING ELECTRON MICROSCOPY; SILICA; TENSILE STRENGTH;

CRYSTALLINE NANOWIRES; DEFECT-FREE; FABRICATION TECHNIQUE; GLASS MATERIALS; MACROSCOPIC SAMPLE; MECHANICAL; SILICA NANO WIRES; SINGLE DEFECT; TOP-DOWN FABRICATION; ULTIMATE STRENGTH;

NANOWIRES;

EID: 65249173921     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl803581r     Document Type: Article

References (29)

1. Dzenis, Y. Science 2004, 304, 1917-1919.
2. Crist, B. Annu. Rev. Mater. Sci. 1995, 25, 295-323.
3. Wu, B.; Heidelberg, A.; Boland, J. J. Nat. Mater. 2005, 4, 525-528.
4. Kaplan-Ashiri, I.; Cohen, S. R.; Gartsman, K.; Ivanovskaya, V.; Heine, T.; Seifert, G.; Wiesel, I.; Wagner, H. D.; Tenne, R. Proc. Natl. Acad. Sci. U.S.A. 2006, 103, 523-528.
5. Wong, S. S.; Sheehan, P. E.; Lieber, C. M. Science 1997, 277, 1971.
6. Iwanaga, H.; Kawai, C. J. Am. Ceram. Soc. 1998, 81, 773-776.
7. Yu, M.-F.; Lourie, O.; Dyer, M. J.; Moloni, K.; Kelly, T. F.; Ruoff, R. S. Science 2000, 287, 637-640.
8. Lee, C.; Wei, X.; Kysar, J. W.; Hone, J.Science 2008, 321, 385-388.
9. Pugno, N. M.; Ruoff, R. S. Philos. Mag. 2004, 84, 2829-2845.
10. Silicon chemistry': from the atom to extended systems; Jutzi, P., Schubert, U, Ed.; Wiley-VCH: Weinheim and Cambridge, 2003; ISBN 3527306471.
11. Bhushan, B. Principles and Applications of Tribology; Wiley: New York, 1999.
12. F300 Specifications spreadsheet, Heraues Quarzglas GmbH.
13. Vukovic, N.; Broderick, N. G. R.; Petrovich, M.; Brambilla, G. J. Lightwave Technol. 2008, 20, 1264-1266.
14. Brambilla, G.; Koizumi, F.; Feng, X.; Richardson, D. J. Electron. Lett. 2005, 41, 400-402.
15. Proctor, B. A.; Whitney, I.; Johnson, J. W. Proc. R. Soc. London 1967, 297A, 534-557.
16. Frenkel, J. Z. Phys. 1926, 37, 572-609.
17. Kurkjian, C. R.; Krause, J. T.; Paek, U. C. J. Phys., Colloq. 1982, 43, 585-586.
18. Silva, E. C. C. M.; Tong, L.; Yip, S.; Van Vliet, K. J. Small 2005, 2, 239-243.
19. Griffith, A. A. Philos. Trans. R. Soc. London 1921, 221A, 163-198.
20. Armstrong, J. L.; Matthewson, M. J.; Kurkjian, C. R. J. Am. Ceram. Soc. 2000, 83, 3100-3108.
21. Marsh, D. M. Proc. R. Soc. London 1964, 282, 33-43.
22. Volarovich, M. P.; Leontieva, A. A. J. Soc. Glass Technol. 1936, 20, 139-143.
23. Hetherington, G.; Jack, K. H.; Kennedy, J. C. Phys. Chan. Glasses 1964, 5, 130-136.
24. Farrell, H. H.; Van Siclen, C. D. J. Vac. Sci. Technol., B 2007, 25, 1441-1447.
25. Brambilla, G.; Xu, F.; Feng, X. Electron. Lett. 2006, 42, 517-519.
26. Xu, F.; Brambilla, G. Jpn. J. Appl. Phys. 2008, 47, 6675-6677.
27. Lucas, J. P. Scr. Metall. Mater. 1995, 32, 743-748.
28. Isaacs, J. D.; Vine, A. C.; Bradner, H.; Bachus, G. E. Science 1966, 151, 682-683.
29. Pearson, J. Acta Astronaut. 1975, 2, 785-799.