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Volumn 20, Issue 6, 2009, Pages
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Building cavities in microspheres and nanospheres
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Author keywords
[No Author keywords available]
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Indexed keywords
REACTIVE IONS;
SILICA SPHERES;
SILICA STRUCTURES;
SIMPLE METHODS;
SILICA;
THICKNESS MEASUREMENT;
REACTIVE ION ETCHING;
MICROSPHERE;
NANOSPHERE;
POLYMER;
SILICON DIOXIDE;
ARTICLE;
CRYSTAL STRUCTURE;
IMAGE ANALYSIS;
IMAGE QUALITY;
PRIORITY JOURNAL;
SCANNING ELECTRON MICROSCOPY;
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EID: 65249097737
PISSN: 09574484
EISSN: 13616528
Source Type: Journal
DOI: 10.1088/0957-4484/20/6/065305 Document Type: Article |
Times cited : (18)
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References (33)
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