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Volumn 25, Issue 6, 2009, Pages 3363-3368

Do liquid films rupture due to the so-called hydrophobic force or migration of dissolved gases?

Author keywords

[No Author keywords available]

Indexed keywords

DISSOLVED GAS; ELECTRICAL DOUBLE LAYERS; FILM RUPTURES; FILM THICKNESS; HYDROPHOBIC ATTRACTIONS; HYDROPHOBIC FORCES; INTERFACIAL POTENTIALS; MICROINTERFEROMETRY; OIL-IN-WATER EMULSIONS; WATER FILMS; WATER INTERFACES;

EID: 65249091579     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la8034648     Document Type: Article
Times cited : (25)

References (52)
  • 3
    • 0003012351 scopus 로고
    • Danielli, J. F, Pankhurst, K. G. A, Riddiford, A. C, Eds, Academic Press: New York
    • Kitchener, J. A. Recent Progress in Surface Science; Danielli, J. F., Pankhurst, K. G. A., Riddiford, A. C., Eds.; Academic Press: New York, 1964; Vol. 1, p 51.
    • (1964) Recent Progress in Surface Science , vol.1 , pp. 51
    • Kitchener, J.A.1
  • 49


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.