-
2
-
-
0011960339
-
-
and references given in this article
-
Lum, K.; Chandler, D.; Weeks, J. D. J. Phys. Chem. B 1999, 103, 4570 and references given in this article.
-
(1999)
J. Phys. Chem. B
, vol.103
, pp. 4570
-
-
Lum, K.1
Chandler, D.2
Weeks, J.D.3
-
4
-
-
0033075838
-
-
Turner, S. F.; Clarke, S. M.; Rennie, A. R.; Thirtle, P. N.; Cooke, D. J.; Li, Z. X.; Thomas, R. K. Langmuir 1999, 15, 1017.
-
(1999)
Langmuir
, vol.15
, pp. 1017
-
-
Turner, S.F.1
Clarke, S.M.2
Rennie, A.R.3
Thirtle, P.N.4
Cooke, D.J.5
Li, Z.X.6
Thomas, R.K.7
-
5
-
-
0034803081
-
-
Howse, J. R.; Steitz, R.; Pannek, M.; Simon, P.; Schubert, D. W.; Findenegg, G. H. Phys. Chem. Chem. Phys. 2001, 3, 4044.
-
(2001)
Phys. Chem. Chem. Phys.
, vol.3
, pp. 4044
-
-
Howse, J.R.1
Steitz, R.2
Pannek, M.3
Simon, P.4
Schubert, D.W.5
Findenegg, G.H.6
-
6
-
-
0000207233
-
-
Parker, J. L.; Claesson, P. M.; Attard, P. J. Phys. Chem. 1994, 98, 8468.
-
(1994)
J. Phys. Chem.
, vol.98
, pp. 8468
-
-
Parker, J.L.1
Claesson, P.M.2
Attard, P.3
-
8
-
-
0035934839
-
-
Tyrrell, J. W. G.; Attard, P. Phys. Rev. Lett. 2001, 87, 176104; Langmuir 2002, 18, 160.
-
(2001)
Phys. Rev. Lett.
, vol.87
, pp. 176104
-
-
Tyrrell, J.W.G.1
Attard, P.2
-
9
-
-
0037039585
-
-
Tyrrell, J. W. G.; Attard, P. Phys. Rev. Lett. 2001, 87, 176104; Langmuir 2002, 18, 160.
-
(2002)
Langmuir
, vol.18
, pp. 160
-
-
-
10
-
-
0033740676
-
-
Yakobov, G. E.; Butt, H.-J.; Vinogradova, O. T. J. Phys. Chem. B 2000, 104, 3407.
-
(2000)
J. Phys. Chem. B
, vol.104
, pp. 3407
-
-
Yakobov, G.E.1
Butt, H.-J.2
Vinogradova, O.T.3
-
11
-
-
0035826642
-
-
Figure 3 of this paper shows gas bubbles on a silanized silica plate with diameters of 1.0-1.5 mm.
-
Vinogradova, O. I.; Yakobov, G. E.; Butt, H.-J. J. Chem. Phys. 2000, 114, 8124. Figure 3 of this paper shows gas bubbles on a silanized silica plate with diameters of 1.0-1.5 mm.
-
(2000)
J. Chem. Phys.
, vol.114
, pp. 8124
-
-
Vinogradova, O.I.1
Yakobov, G.E.2
Butt, H.-J.3
-
12
-
-
0025445393
-
-
3 (30%), ratio 1:5:1 by volume, for 10 min, followed by excessive rinsing with Milli-Q-water; see also: Kern, W. J. Electrochem. Soc. 1990, 137, 1887.
-
(1990)
J. Electrochem. Soc.
, vol.137
, pp. 1887
-
-
Kern, W.1
-
13
-
-
0000844941
-
-
Satjia, S. K.; Russell, T. P.; Sirota, E. B.; Hughes, C. T.; Sinha, S. K. Macromolecules 1990, 23, 3860.
-
(1990)
Macromolecules
, vol.23
, pp. 3860
-
-
Satjia, S.K.1
Russell, T.P.2
Sirota, E.B.3
Hughes, C.T.4
Sinha, S.K.5
-
14
-
-
0037156149
-
-
Howse, J. R.; Manzanares-Papayanopolous, E.; McLure, I. A.; Bowers, J.; Steitz, R.; Findenegg, G. H. J. Chem. Phys. 2002, 116, 7177.
-
(2002)
J. Chem. Phys.
, vol.116
, pp. 7177
-
-
Howse, J.R.1
Manzanares-Papayanopolous, E.2
McLure, I.A.3
Bowers, J.4
Steitz, R.5
Findenegg, G.H.6
-
15
-
-
0029352357
-
-
Mezei, F.; Goloub, R.; Klose, F.; Toews, H. Physica B 1995, 213+214, 898.
-
(1995)
Physica B
, vol.213-214
, pp. 898
-
-
Mezei, F.1
Goloub, R.2
Klose, F.3
Toews, H.4
-
18
-
-
0000934857
-
-
and references given in this article
-
Russell, T. P. Physica B 1998, 227, 267 and references given in this article.
-
(1998)
Physica B
, vol.227
, pp. 267
-
-
Russell, T.P.1
-
20
-
-
0013101777
-
-
note
-
I/4 in both cases. It is believed that this ambiguous result is caused by experimental artifacts.
-
-
-
-
23
-
-
0013145687
-
-
note
-
2 (unpublished results), we found a height variation from center to edge of ∼1.2% over 20 mm. Taking into account the X-ray value of 27.7 nm and the known height variation, the error of the thickness value extended to the footprint size of the neutron beam is 27.7 × 0.012 = 0.3 nm. Hence, normalized to the footprint size, the thickness values given in Table 2 are indistin-guishable.
-
-
-
-
24
-
-
0034667107
-
-
Zimmermann, K.-M.; Tolan, M.; Weber, R.; Stettner, J.; Doerr, A. K.; Press, W. Phys. Rev. B 2000, 62, 10377.
-
(2000)
Phys. Rev. B
, vol.62
, pp. 10377
-
-
Zimmermann, K.-M.1
Tolan, M.2
Weber, R.3
Stettner, J.4
Doerr, A.K.5
Press, W.6
-
25
-
-
0034310104
-
-
Press: W.
-
Doerr, A. K.; Tolan, M.; Schlomka, J.-P.; Press: W. Europhys. Lett. 2000, 52, 330.
-
(2000)
Europhys. Lett.
, vol.52
, pp. 330
-
-
Doerr, A.K.1
Tolan, M.2
Schlomka, J.-P.3
-
26
-
-
0013151198
-
-
note
-
More detailed information on the density gradient across the interface may become available by taking the simple box model as a starting point for further refinement, making use of additional phase estimation as outlined in ref 23.
-
-
-
-
27
-
-
11544353645
-
-
Carambassis, A.; Jonker, L. C.; Attard, P.; Rutland, M. W. Phys. Rev. Lett. 1998, 80, 5357.
-
(1998)
Phys. Rev. Lett.
, vol.80
, pp. 5357
-
-
Carambassis, A.1
Jonker, L.C.2
Attard, P.3
Rutland, M.W.4
-
28
-
-
0032141140
-
-
Ederth, T.; Claesson, P. M.; Liedberg, B. Langmuir 1998, 14, 4782.
-
(1998)
Langmuir
, vol.14
, pp. 4782
-
-
Ederth, T.1
Claesson, P.M.2
Liedberg, B.3
-
29
-
-
0033567406
-
-
Ishida, N.; Kinoshita, N.; Miyahara, M.; Higashitani, K. J. Colloid Interface Sci. 1999, 216, 387.
-
(1999)
J. Colloid Interface Sci.
, vol.216
, pp. 387
-
-
Ishida, N.1
Kinoshita, N.2
Miyahara, M.3
Higashitani, K.4
-
31
-
-
25744445633
-
-
in press
-
Schwendel, D.; Hayashi, T.; Steitz, R.; Schreiber, F.; Dahint, R.; Pertsin, A.; Grunze, M. Langmuir in press.
-
Langmuir
-
-
Schwendel, D.1
Hayashi, T.2
Steitz, R.3
Schreiber, F.4
Dahint, R.5
Pertsin, A.6
Grunze, M.7
-
32
-
-
0037004668
-
-
Gutberlet, T.; Steitz, R.; Howse, J. R.; Estrela-Lopis, L; Klösgen, B. Appl. Phys. A: Mater. Sci. Process. 2002, 74 (Suppl.), S1262.
-
(2002)
Appl. Phys. A: Mater. Sci. Process.
, vol.74
, Issue.SUPPL.
-
-
Gutberlet, T.1
Steitz, R.2
Howse, J.R.3
Estrela-Lopis, L.4
Klösgen, B.5
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