Interferometric sensing platform with dielectric nanostructured thin films

Optics Express

Volumn 17, Issue 8, 2009, Pages 6655-6664

  Celo, D ^a   Post, E ^b   Summers, M ^b   Smy, T ^a   Brett, M J ^b   Albert, J ^a  

^a CARLETON UNIVERSITY   (Canada)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; FABRICATION; HIGH-K DIELECTRIC; INTERFEROMETERS; PHASE SHIFT; REFRACTIVE INDEX; THIN FILMS;

GLANCING ANGLE DEPOSITION TECHNIQUE; INTERFEROMETRIC SENSING; NANOSTRUCTURED THIN FILM; REFRACTIVE INDEX MEASUREMENT; SENSING ABILITIES; TIME-RESPONSE MEASUREMENTS; TRANSMISSION SPECTRUMS; WAVEGUIDE TECHNOLOGY;

OPTICAL FILMS;

NANOMATERIAL;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; COMPUTER AIDED DESIGN; EQUIPMENT; EQUIPMENT DESIGN; GAS; INSTRUMENTATION; INTERFEROMETRY; NANOTECHNOLOGY; REFRACTOMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; TRANSDUCER; ULTRASTRUCTURE;

COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; GASES; INTERFEROMETRY; MEMBRANES, ARTIFICIAL; NANOSTRUCTURES; NANOTECHNOLOGY; REFRACTOMETRY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; TRANSDUCERS;

EID: 65149087516     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.006655     Document Type: Article

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