Synthesis of tungsten nanoparticles by solvothermal decomposition of tungsten hexacarbonyl

International Journal of Refractory Metals and Hard Materials

Volumn 27, Issue 4, 2009, Pages 784-791

  Sahoo, Prasanta Kumar ^a,c   Kalyan Kamal, S S ^a,c   Premkumar, M ^a   Jagadeesh Kumar, T ^a   Sreedhar, B ^b   Singh, A K ^a   Srivastava, S K ^c   Chandra Sekhar, K ^a  

^a DEFENCE METALLURGICAL RESEARCH LABORATORY   (India)

^b INDIAN INSTITUTE OF CHEMICAL TECHNOLOGY   (India)

^c INDIAN INSTITUTE OF TECHNOLOGY   (India)

Author keywords

Surfactants and agglomeration; Thermal decomposition; Tungsten nanoparticles

Indexed keywords

BODY-CENTERED-CUBIC; CHEMICAL CHARACTERIZATIONS; CONCENTRATION OF; ENVIRONMENTAL SCANNING ELECTRON MICROSCOPIES; FOURIER TRANSFORM INFRA-RED SPECTROSCOPIES; GAS ANALYZERS; INDUCTIVELY COUPLED PLASMA-OPTICAL-EMISSION SPECTROMETRIES; NANO-POWDERS; OXIDATION STATE; PHOSPHINE OXIDES; SMALL - ANGLE X-RAY SCATTERINGS; SOLVOTHERMAL DECOMPOSITIONS; STRUCTURAL CHARACTERIZATIONS; SURFACTANT MIXTURES; SURFACTANTS AND AGGLOMERATION; TEM; THERMAL DECOMPOSITION; TUNGSTEN HEXACARBONYL; X-RAY DIFFRACTIONS; X-RAY PHOTOELECTRON SPECTROSCOPIES; XPS;

CHARACTERIZATION; EMISSION SPECTROSCOPY; FLOCCULATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; FOURIER TRANSFORMS; INDUCTIVELY COUPLED PLASMA; LEAKAGE (FLUID); NANOPARTICLES; OLEIC ACID; OPTICAL EMISSION SPECTROSCOPY; PHOSPHORUS COMPOUNDS; PHOTORESISTS; POLYMER BLENDS; PYROLYSIS; SCANNING ELECTRON MICROSCOPY; SPECTROMETRY; SPECTROSCOPIC ANALYSIS; SPECTRUM ANALYSIS; SURFACE ACTIVE AGENTS; SYNTHESIS (CHEMICAL); THERMOGRAVIMETRIC ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; TUNGSTEN; X RAY SCATTERING;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 64449087851     PISSN: 02634368     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijrmhm.2009.01.005     Document Type: Article

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