Surface modification studies of polyimide films using rutherford backscattering and forward recoil spectrometry

Chemistry of Materials

Volumn 8, Issue 5, 1996, Pages 1035-1041

  Stoffel, Nancy C ^a   Hsieh, Meng ^a   Chandra, Sweta ^a   Kramer, Edward J ^a  

^a Cornell University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000133573     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm950317b     Document Type: Article

References (22)

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