Composition and crystallinity of silicon nanoparticles synthesised by hot wire thermal catalytic pyrolysis at different pressures

Thin Solid Films

Volumn 517, Issue 12, 2009, Pages 3484-3487

  Scriba, M R ^a,b   Britton, D T ^a   Arendse, C ^b   van Staden, M J ^c   Harting M ^a  

^a UNIVERSITY OF CAPE TOWN   (South Africa)

^b DSI CSIR Nanotechnology Innovation Centre   (South Africa)

^c NATIONAL METROLOGY INSTITUTE OF SOUTH AFRICA   (South Africa)

Author keywords

Raman spectroscopy; Silicon nanoparticles; Thermal catalytic pyrolysis; Transmission electron microscopy; X ray diffraction; X ray photoelectron spectroscopy

Indexed keywords

CRYSTALLINE FRACTIONS; CRYSTALLINITY; DEGREE OF CRYSTALLINITY; EFFECT OF PRESSURES; HOT WIRES; LOWER PRESSURES; OXIDE SHELLS; SILICON NANOPARTICLES; SURFACE LAYERS; TEM; THERMAL CATALYTIC PYROLYSIS; TUNGSTEN FILAMENTS; X-RAY PHOTOEMISSION SPECTROSCOPIES;

DIFFRACTION; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELECTRONS; EMISSION SPECTROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LIGHT; NANOPARTICLES; ORGANIC POLYMERS; PHOTOELECTRICITY; PHOTOIONIZATION; PHOTONS; PRESSURE EFFECTS; PYROLYSIS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SILANES; SPECTRUM ANALYSIS; SYNTHESIS (CHEMICAL); THERMOGRAVIMETRIC ANALYSIS; TUNGSTEN; WIRE; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAYS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 64349119765     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.01.047     Document Type: Article

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