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Materials Science Forum

Volumn 609, Issue , 2009, Pages 133-137

Properties of ZnO thin films grown on Si substrates by ultrasonic spray and ZnO/Si heterojunctions

(6) Zebbar, N a Aida, M S b Hafdallah, A E K b Daranfad, O b Lekiket, H b Kechouane, M a

a UNIVERSITY OF SCIENCES AND TECHNOLOGY HOUARI BOUMEDIENE (Algeria)

b Universite Mentouri Constantine (Algeria)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CURRENT VOLTAGE CHARACTERISTICS; II-VI SEMICONDUCTORS; INDIUM COMPOUNDS; METALLIC FILMS; OPTICAL PROPERTIES; SILICON; SILICON COMPOUNDS; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION; ZINC OXIDE;

CURRENT-VOLTAGE; DOPED ZNO; EXPERIMENTAL ANALYSIS; PROPERTY; SI SUBSTRATES; SUBSTRATES TEMPERATURE; ULTRASONIC SPRAY; ZNO FILMS; ZNO THIN FILM; ZNO/P-SI;

HETEROJUNCTIONS;

EID: 64349089243 PISSN: 02555476 EISSN: 16629752 Source Type: Book Series
DOI: 10.4028/www.scientific.net/msf.609.133 Document Type: Conference Paper

Times cited : (7)

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