-
1
-
-
0003442771
-
-
edited by S. Morita, R. Wiesendangaer, and E. Meyer (Springer, Berlin, Heiderblg), and references therein.
-
Noncontact Atomic Force Microscopy, edited by, S. Morita, R. Wiesendangaer, and, E. Meyer, (Springer, Berlin, Heiderblg, 2002), and references therein.
-
(2002)
Noncontact Atomic Force Microscopy
-
-
-
2
-
-
0034698297
-
-
0036-8075 10.1126/science.289.5478.422.
-
F. J. Giessibl, S. Hambacher, H. Bielefeldt, and J. Mannhart, Science 0036-8075 10.1126/science.289.5478.422 289, 422 (2000).
-
(2000)
Science
, vol.289
, pp. 422
-
-
Giessibl, F.J.1
Hambacher, S.2
Bielefeldt, H.3
Mannhart, J.4
-
3
-
-
0001449391
-
-
0169-4332 10.1016/S0169-4332(98)00553-4.
-
F. J. Giessibl, H. Bielefeldt, S. Hambacher, and J. Mannhart, Appl. Surf. Sci. 0169-4332 10.1016/S0169-4332(98)00553-4 140, 352 (1999).
-
(1999)
Appl. Surf. Sci.
, vol.140
, pp. 352
-
-
Giessibl, F.J.1
Bielefeldt, H.2
Hambacher, S.3
Mannhart, J.4
-
4
-
-
20844443649
-
-
0003-6951 10.1063/1.1923200.
-
S. Kawai, S. Kitamura, D. Kobayashi, S. Meguro, and H. Kawakatsu, Appl. Phys. Lett. 0003-6951 10.1063/1.1923200 86, 193107 (2005).
-
(2005)
Appl. Phys. Lett.
, vol.86
, pp. 193107
-
-
Kawai, S.1
Kitamura, S.2
Kobayashi, D.3
Meguro, S.4
Kawakatsu, H.5
-
5
-
-
0037581604
-
-
0034-6748 10.1063/1.1150690.
-
S. Rast, C. Wattinger, U. Gysin, and E. Meyer, Rev. Sci. Instrum. 0034-6748 10.1063/1.1150690 71, 2772 (2000).
-
(2000)
Rev. Sci. Instrum.
, vol.71
, pp. 2772
-
-
Rast, S.1
Wattinger, C.2
Gysin, U.3
Meyer, E.4
-
6
-
-
18744405727
-
-
0034-6748 10.1063/1.1896938.
-
T. Fukuma, M. Kimura, K. Kobayashi, K. Matsushige, and H. Yamada, Rev. Sci. Instrum. 0034-6748 10.1063/1.1896938 76, 053704 (2005).
-
(2005)
Rev. Sci. Instrum.
, vol.76
, pp. 053704
-
-
Fukuma, T.1
Kimura, M.2
Kobayashi, K.3
Matsushige, K.4
Yamada, H.5
-
7
-
-
64149125199
-
-
in, edited by B. Bhushan and S. Kawata (Springer, Berlin, Heiderblg), Cha.
-
H. Yamada and K. Kobayashi, in Applied Scanning Probe Methods VI, edited by, B. Bhushan, and, S. Kawata, (Springer, Berlin, Heiderblg, 2006), Chap..
-
(2006)
Applied Scanning Probe Methods VI
-
-
Yamada, H.1
Kobayashi, K.2
-
8
-
-
0035669467
-
-
0034-6748 10.1063/1.1416104.
-
K. Kobayashi, H. Yamada, H. Itoh, T. Horiuchi, and K. Matsushige, Rev. Sci. Instrum. 0034-6748 10.1063/1.1416104 72, 4383 (2001).
-
(2001)
Rev. Sci. Instrum.
, vol.72
, pp. 4383
-
-
Kobayashi, K.1
Yamada, H.2
Itoh, H.3
Horiuchi, T.4
Matsushige, K.5
-
9
-
-
2942639958
-
-
0009-2614 10.1016/j.cplett.2004.04.121.
-
M. Takada and H. Tada, Chem. Phys. Lett. 0009-2614 10.1016/j.cplett.2004. 04.121 392, 265 (2004).
-
(2004)
Chem. Phys. Lett.
, vol.392
, pp. 265
-
-
Takada, M.1
Tada, H.2
-
10
-
-
2442495323
-
-
0021-8979 10.1063/1.1690485.
-
T. Fukuma, K. Kobayashi, H. Yamada, and K. Matsushige, J. Appl. Phys. 0021-8979 10.1063/1.1690485 95, 4742 (2004).
-
(2004)
J. Appl. Phys.
, vol.95
, pp. 4742
-
-
Fukuma, T.1
Kobayashi, K.2
Yamada, H.3
Matsushige, K.4
-
11
-
-
5144229663
-
-
0021-4922 10.1143/JJAP.43.4691.
-
T. Yoda, T. Ichii, T. Fukuma, K. Kobayashi, H. Yamada, and K. Matsushige, Jpn. J. Appl. Phys., Part 1 0021-4922 10.1143/JJAP.43.4691 43, 4691 (2004).
-
(2004)
Jpn. J. Appl. Phys., Part 1
, vol.43
, pp. 4691
-
-
Yoda, T.1
Ichii, T.2
Fukuma, T.3
Kobayashi, K.4
Yamada, H.5
Matsushige, K.6
-
12
-
-
1442311750
-
-
0957-4484 10.1088/0957-4484/15/2/019.
-
L. Nony, P. Bennewitz, O. Pfeiffer, E. Gnecco, A. Baratoff, E. Meyer, T. Eguchi, A. Gourdon, and C. Joachim, Nanotechnology 0957-4484 10.1088/0957-4484/15/2/019 15, S91 (2004).
-
(2004)
Nanotechnology
, vol.15
, pp. 91
-
-
Nony, L.1
Bennewitz, P.2
Pfeiffer, O.3
Gnecco, E.4
Baratoff, A.5
Meyer, E.6
Eguchi, T.7
Gourdon, A.8
Joachim, C.9
-
13
-
-
33947510247
-
-
0957-4484 10.1088/0957-4484/18/8/084004.
-
M. Fendrich, T. Kunstmann, D. Paulkowski, and R. Möller, Nanotechnology 0957-4484 10.1088/0957-4484/18/8/084004 18, 084004 (2007).
-
(2007)
Nanotechnology
, vol.18
, pp. 084004
-
-
Fendrich, M.1
Kunstmann, T.2
Paulkowski, D.3
Möller, R.4
|