|
Volumn 54, Issue 14, 2009, Pages 3781-3787
|
Impedance model of electrolyte-insulator-semiconductor structure with porous silicon semiconductor
|
Author keywords
Capacitance; Conductance; Impedance model; Photoelectrode; Porous silicon; Porous silicon nitrided TiO2 structure; Porous silicon polyaniline structure
|
Indexed keywords
APPLIED BIAS;
CONDUCTANCE;
CONSTANT PHASE ELEMENTS;
ELECTROLYTE INSULATOR SEMICONDUCTORS;
IMPEDANCE MODEL;
IMPEDANCE SPECTRUM;
INTERFACIAL LAYERS;
MEASUREMENT TOOLS;
MESH STRUCTURES;
PHOTOELECTRODE;
PHYSICAL MODELS;
POROUS STRUCTURES;
SEMICONDUCTOR INTERFACES;
SILICON MICROCHANNELS;
CAPACITANCE;
ELECTRIC CONDUCTIVITY;
ELECTROLYSIS;
ELECTROLYTES;
MODEL STRUCTURES;
NONMETALS;
PHASE INTERFACES;
POLYANILINE;
SEMICONDUCTING SILICON;
SEMICONDUCTING SILICON COMPOUNDS;
SEMICONDUCTOR MATERIALS;
SURFACE CHEMISTRY;
POROUS SILICON;
|
EID: 64049115487
PISSN: 00134686
EISSN: None
Source Type: Journal
DOI: 10.1016/j.electacta.2009.01.071 Document Type: Article |
Times cited : (16)
|
References (39)
|