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Volumn 41, Issue 7-8, 1996, Pages 1313-1321

Impedance study of aging porous silicon films

Author keywords

Electrical impedance; Porous silicon

Indexed keywords

AGING OF MATERIALS; ELECTRIC CONDUCTIVITY; ELECTRIC FIELDS; ELECTRIC IMPEDANCE; ELECTROLYTES; EQUIVALENT CIRCUITS; FILM GROWTH; LUMINESCENCE; POROUS SILICON; RELAXATION PROCESSES; SPECTROSCOPY;

EID: 0030144491     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/0013-4686(95)00452-1     Document Type: Article
Times cited : (8)

References (12)
  • 2
    • 0040824330 scopus 로고
    • (Edited by Z. C. Feng and R. Tsu) World Scientific, Singapore
    • F. Kozlowski, P. Steiner and W. Lang, in: Porous Silicon (Edited by Z. C. Feng and R. Tsu) p. 149. World Scientific, Singapore (1994).
    • (1994) Porous Silicon , pp. 149
    • Kozlowski, F.1    Steiner, P.2    Lang, W.3
  • 7
    • 0003792371 scopus 로고
    • (Edited by J. Ross Macdonald). John Wiley and Sons, New York
    • J. Ross Macdonald and W. B. Johnson, in: Impedance Spectroscopy (Edited by J. Ross Macdonald). John Wiley and Sons, New York (1988).
    • (1988) Impedance Spectroscopy
    • Macdonald, J.R.1    Johnson, W.B.2
  • 8
    • 0040824328 scopus 로고
    • (Edited by Z. C. Feng and R. Tsu) World Scientific, Singapore
    • V. Parkhutik, in: Porous Silicon, (Edited by Z. C. Feng and R. Tsu) pp. 301-328. World Scientific, Singapore (1994).
    • (1994) Porous Silicon , pp. 301-328
    • Parkhutik, V.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.