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Volumn 41, Issue 7-8, 1996, Pages 1313-1321
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Impedance study of aging porous silicon films
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Author keywords
Electrical impedance; Porous silicon
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Indexed keywords
AGING OF MATERIALS;
ELECTRIC CONDUCTIVITY;
ELECTRIC FIELDS;
ELECTRIC IMPEDANCE;
ELECTROLYTES;
EQUIVALENT CIRCUITS;
FILM GROWTH;
LUMINESCENCE;
POROUS SILICON;
RELAXATION PROCESSES;
SPECTROSCOPY;
AC IMPEDANCE SPECTROSCOPY;
ELECTROLYTE RESIDUALS;
POST GROWTH TREATMENT;
SEMICONDUCTING FILMS;
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EID: 0030144491
PISSN: 00134686
EISSN: None
Source Type: Journal
DOI: 10.1016/0013-4686(95)00452-1 Document Type: Article |
Times cited : (8)
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References (12)
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