The effect of the interface oxidation ontunneling conductance of Co 2MnSi/MgO/Co2MnSi magnetic tunneljunction

Journal of Physics Condensed Matter

Volumn 21, Issue 6, 2009, Pages

  Miura, Yoshio ^a   Abe, Kazutaka ^a   Shirai, Masafumi ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC POSITIONS; FIRST-PRINCIPLES CALCULATIONS; INTERFACIAL SCATTERINGS; MAGNETIC TUNNEL JUNCTIONS; MGO BARRIERS; SINGLE OXIDES; SPIN ELECTRONS; TUNNEL CONDUCTANCES;

ELECTRONIC STRUCTURE; MAGNETIC DEVICES; MANGANESE; OXIDATION; SEMICONDUCTOR JUNCTIONS; TUNNEL JUNCTIONS; TUNNELS; WAVEGUIDE JUNCTIONS;

MANGANESE COMPOUNDS;

EID: 63749119305     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/21/6/064245     Document Type: Article

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