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Physical Review Letters
Volumn 96, Issue 11, 2006, Pages
Comment on "destructive effect of disorder and bias voltage on interface resonance transmission in symmetric tunnel junctions"
Author keywords

[No Author keywords available]
Indexed keywords

EID: 33645051702     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.96.119601     Document Type: Review
Times cited : (20)
References (5)
  • 1
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    • Tusche, C.1
  • 2
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    • PRBMDO 0163-1829 10.1103/PhysRevB.65.064425
    • O. Wunnicke, Phys. Rev. B PRBMDO 0163-1829 65, 064425 (2002). 10.1103/PhysRevB.65.064425
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    • Wunnicke, O.1
  • 3
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    • cond-mat/0511663.
    • E.Y. Tsymbal, cond-mat/0511663.
    • Tsymbal, E.Y.1
  • 4
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    • PRBMDO 0163-1829 10.1103/PhysRevB.72.140404
    • K.D. Belashchenko, Phys. Rev. B PRBMDO 0163-1829 72, 140404(R) (2005). 10.1103/PhysRevB.72.140404
    • (2005) Phys. Rev. B , vol.72
    • Belashchenko, K.D.1
  • 5
    • 0242362628 scopus 로고    scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.68.092402
    • X.-G. Zhang, Phys. Rev. B PRBMDO 0163-1829 68, 092402 (2003). 10.1103/PhysRevB.68.092402
    • (2003) Phys. Rev. B , vol.68 , pp. 092402
    • Zhang, X.-G.1

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.