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Volumn 138, Issue 1, 2009, Pages 193-200

Investigation of the perovskite ceramic Li0.30La0.56TiO3 by Pulsed Force Mode AFM for pH sensor application

Author keywords

Atomic force microscopy; Ceramics; Ionic conductors; Perovskite; pH sensors

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMS; CERAMIC MATERIALS; ELECTROCHEMICAL ELECTRODES; HYDROPHILICITY; IONIC CONDUCTIVITY; LANTHANUM; OXIDE MINERALS; PEROVSKITE; PH EFFECTS; PH SENSORS; SENSORS; SINTERING; SURFACE ROUGHNESS; TRACE ANALYSIS;

EID: 63749115394     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2008.12.031     Document Type: Article
Times cited : (5)

References (32)
  • 7
    • 63749106006 scopus 로고    scopus 로고
    • French Patent 2002 FR 0210730, International Patent 2004
    • WO2004/020360
    • C. Bohnke, O. Bohnke, H. Duroy, J. L. Fourquet, A. Leblé, 2002, French Patent 2002 FR 0210730, International Patent 2004 WO2004/020360.
    • (2002)
    • Bohnke, C.1    Bohnke, O.2    Duroy, H.3    Fourquet, J.L.4    Leblé, A.5
  • 13
    • 63749102813 scopus 로고    scopus 로고
    • PhD Thesis, Université du Maine, Le Mans
    • Q. N. Pham, PhD Thesis, Université du Maine, Le Mans, 2007.
    • (2007)
    • Pham, Q.N.1
  • 15
    • 63749106006 scopus 로고    scopus 로고
    • French Patent 2002 FR 0210734, International Patent 2004
    • WO2004/020361
    • C. Bohnke, O. Bohnke, H. Duroy, J. L. Fourquet. A. Leblé, 2002, French Patent 2002 FR 0210734, International Patent 2004 WO2004/020361.
    • (2002)
    • Bohnke, C.1    Bohnke, O.2    Duroy, H.3    Fourquet, J.L.4    Leblé, A.5
  • 23
    • 33745787865 scopus 로고    scopus 로고
    • Drelich J., and Mittal K.L. (Eds), Brill Academic Publishers, Leiden, Boston
    • In: Drelich J., and Mittal K.L. (Eds). Atomic Force Microscopy in Adhesion Studies (2005), Brill Academic Publishers, Leiden, Boston
    • (2005) Atomic Force Microscopy in Adhesion Studies


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.