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Volumn 20, Issue 7, 2004, Pages 2707-2712
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In situ determination of the thermodynamic surface properties of chemically modified surfaces on a local scale: An attempt with the atomic force microscope
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Author keywords
[No Author keywords available]
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Indexed keywords
ADHESION;
ATOMIC FORCE MICROSCOPY;
CHEMICAL ANALYSIS;
CHEMICAL MODIFICATION;
GRAFTING (CHEMICAL);
INTERFACES (MATERIALS);
INTERFACIAL ENERGY;
MONOLAYERS;
SELF ASSEMBLY;
SILICON NITRIDE;
SILICON WAFERS;
THERMODYNAMIC PROPERTIES;
ADHESIVE FORCES;
CAPILLARY CONDENSATION;
CONTACT MODE;
DEFLECTION-DEFLECTION CURVES;
HYDROXYL GROUP;
SELD ASSEMBLED MONOLAYERS;
THERMODYNAMIC WORK OF ADHESION;
ORGANIC COMPOUNDS;
SILICON;
SILICON DERIVATIVE;
SILICON NITRIDE;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CHEMISTRY;
SURFACE PROPERTY;
THERMODYNAMICS;
MICROSCOPY, ATOMIC FORCE;
SILICON;
SILICON COMPOUNDS;
SURFACE PROPERTIES;
THERMODYNAMICS;
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EID: 1842728308
PISSN: 07437463
EISSN: None
Source Type: Journal
DOI: 10.1021/la034884m Document Type: Article |
Times cited : (35)
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References (26)
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