|
|
Volumn 40, Issue 4-5, 2009, Pages 697-705
|
|
Nanostructures defined by the local oxidation of the ferromagnetic GaMnAs layer
a
|
|
Author keywords
Atomic force microscopy; Ferromagnetic semiconductor; Local anodic oxidation; Magnetoresistence
|
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
ATOMS;
CRYSTAL GROWTH;
ELECTRIC CONDUCTIVITY;
ELECTRIC RESISTANCE;
FERROMAGNETIC MATERIALS;
FERROMAGNETISM;
GALLIUM ALLOYS;
HUMIDITY CONTROL;
MAGNETIC FIELD EFFECTS;
MAGNETORESISTANCE;
MOLECULAR BEAMS;
MOLECULAR DYNAMICS;
MOS CAPACITORS;
SEMICONDUCTOR GROWTH;
SEMICONDUCTOR MATERIALS;
AFM;
APPLIED VOLTAGES;
ATOMIC FORCE MICROSCOPES;
CONDUCTIVE DIAMONDS;
CONTACT MODES;
FERROMAGNETIC SEMICONDUCTOR;
LOCAL ANODIC OXIDATION;
LOCAL OXIDATIONS;
LOW TEMPERATURES;
MAGNETORESISTANCE MEASUREMENTS;
MAGNETORESISTENCE;
MICRO-MAGNETIC SIMULATIONS;
MOLECULAR-BEAM EPITAXIES;
NANOLINES;
TIP FORCES;
TIP SPEED;
ANODIC OXIDATION;
|
|
EID: 63749107764
PISSN: 00262692
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mejo.2008.07.039 Document Type: Article |
|
Times cited : (2)
|
|
References (10)
|
